"The JRP SIB08 subnano will meet the growing requirement for the broader dissemination of the SI unit of length at the sub-nanometre level. This will be achieved with the development of state of the art techniques for sub nanometre length metrology by improving and cross verifying the metrology of x-ray interferometers, capacitive sensors and Fabry-Perot interferometers. This will lead to the investigation of a potential portable transfer standard for verifying the performance of sub-nanometre displacement measuring instrumentation outside of the purely NMI environment." . "0"^^ . . . "0"^^ . "0"^^ . "2014-03-06+01:00"^^ . . . "2013-01-01+01:00"^^ . . . . . "traceability" . . . "http://www.isvav.cz/projectDetail.do?rowId=7AX13013"^^ . . . "traceability; length measurement"@en . . "Traceability of sub-nm length measurements"@en . "The JRP SIB08 subnano will meet the growing requirement for the broader dissemination of the SI unit of length at the sub-nanometre level. This will be achieved with the development of state of the art techniques for sub nanometre length metrology by improving and cross verifying the metrology of x-ray interferometers, capacitive sensors and Fabry-Perot interferometers. This will lead to the investigation of a potential portable transfer standard for verifying the performance of sub-nanometre displacement measuring instrumentation outside of the purely NMI environment."@en . "0"^^ . "7AX13013" . . . . "2015-06-30+02:00"^^ . . "2015-05-28+02:00"^^ . "Traceability of sub-nm length measurements" . "1"^^ .