. . . "Proposed project will elaborate new measuring method based on the electro-ultrasonic spectroscopy for testing of materials and electronic devices such as thin and thick film resistors, capacitors and varistors. Aim of this work is theoretical explanation of new effects which are the results of interaction between phonon corresponding to the elastic waves and electron transport near cracks and inhomogenities in the device structure. Nonlinear electro-ultrasonic spectroscopy is sensitivite to all cracks in conductive thick film and it gives information on material quality and reproducibility of technology. Resonant Ultrasonic Spectroscopy (RUS) allows differentiating the elements with different physical structure due to some discrepancies in the technological process of their production. They can be used as precursory phenomena for devices. We can use this method to compare different preparation technologies and defect creation during the operating life time. Other application field could be in the"@en . . . "100"^^ . "2010-01-01+01:00"^^ . . . "Elektro-ultrazvukov\u00E1 a \u00FAzkop\u00E1smov\u00E1 resonantn\u00ED ultrazvukov\u00E1 spektroskopie elektronick\u00FDch materi\u00E1l\u016F a sou\u010D\u00E1stek"@cs . "4"^^ . "0"^^ . "100"^^ . "4"^^ . "0"^^ . . . "The electro-ultrasonic and narrowband resonant ultrasonic spectroscopy for testing of electronic materials and devices"@en . "1"^^ . . . . "2011-12-31+01:00"^^ . "Navr\u017Een\u00FD projekt se zab\u00FDv\u00E1 vyu\u017Eit\u00EDm metody elektro-ultrazvukov\u00E9 spektroskopie na testov\u00E1n\u00ED materi\u00E1l\u016F a elektronick\u00FDch sou\u010D\u00E1stek jako jsou tlustovrstvov\u00E9 resistory, kondenz\u00E1tory a varistory. Z\u00E1kladem je teoretick\u00FD popis nov\u00FDch efekt\u016F, je\u017E jsou d\u016Fsledkem interakce fonon\u016F vybuzen\u00FDch mechanickou vlnou a vodivostn\u00EDch elektron\u016F v bl\u00EDzkosti trhlin a nehomogenit ve struktu\u0159e sou\u010D\u00E1stek. Neline\u00E1rn\u00ED elektro-ultrazvukov\u00E1 spektroskopie je testovac\u00ED metoda citliv\u00E1 na p\u0159\u00EDtomnost trhlin ve vodiv\u00FDch vrstv\u00E1ch a pod\u00E1v\u00E1 informaci o kvalit\u011B materi\u00E1l\u016F a reprodukovatelnosti technologie. Resonantn\u00ED ultrazvukov\u00E1 spektroskopie umo\u017E\u0148uje rozli\u0161en\u00ED materi\u00E1l\u016F s r\u016Fznou fyzik\u00E1ln\u00ED strukturou, \u010D\u00EDm\u017E lze rozli\u0161it r\u016Fzn\u00E9 nedokonalosti technologick\u00FDch proces\u016F p\u0159i v\u00FDrob\u011B sou\u010D\u00E1stek. V\u00FDsledy testov\u00E1n\u00ED kvality a spolehlivosti elektronick\u00FDch materi\u00E1l\u016F t\u011Bmito metodami budou ov\u011B\u0159eny pomoc\u00ED standardn\u00EDch testovac\u00EDch metod - m\u011B\u0159en\u00ED elektronick\u00E9ho \u0161umu, elektrick\u00E9 nelinearity a pomoc\u00ED AFM."@cs . "Electro-ultrasonic spectroscopy; Narrowband resonant ultrasonic spectroscopy; Noise; Electronic materials; Testing; Reliability"@en .