. "18"^^ . . . "Neuvedeno."@en . "18"^^ . "C\u00EDlem projektu je realizovat experiment\u00E1ln\u00ED za\u0159\u00EDzen\u00ED a nal\u00E9zt metody vyu\u017E\u00EDvaj\u00EDc\u00ED opticky chycenou sondu k m\u011B\u0159en\u00ED sil. Optick\u00E9 uchycen\u00ED sondy je velmi \u0161etrn\u00E9 ke studovan\u00E9mu povrchu a umo\u017E\u0148uje zji\u0161\u0165ov\u00E1n\u00ED vlastnost\u00ED vnit\u0159n\u00EDch ploch transparentn\u00EDch objekt\u016F. Navrhovan\u00FDm syst\u00E9mem bude mo\u017En\u00E9 m\u011B\u0159it s\u00EDly a\u017E o dva \u0159\u00E1dy men\u0161\u00ED (1 pN - 100 pN) ne\u017E s\u00EDly, kter\u00E9 jsou detekovateln\u00E9 mikroskopem vyu\u017E\u00EDvaj\u00EDc\u00EDm interakce meziatomov\u00FDch sil (ARM). \u00DAsp\u011B\u0161n\u00E9 zji\u0161t\u011Bn\u00ED takto mal\u00FDch sil vy\u017Eaduje t\u0159\u00EDrozm\u011Brnou detekci polohy sondy s p\u0159esnost\u00ED 1-10 nm, kter\u00E9 lze dos\u00E1hnout kvadrantov\u00FDm detektorem a dvojic\u00ED detektor\u016F um\u00EDst\u011Bn\u00FDch v bl\u00EDzkosti obrazu sondy vytvo\u0159en\u00E9ho optick\u00FDm mikroskopem. Jako alternativn\u00EDho zp\u016Fsobu bude vyu\u017Eito sledov\u00E1n\u00ED zm\u011Bny spektra vyza\u0159ovan\u00E9ho opticky chycen\u00FDm mikrolaserem b\u011Bhem jeho p\u0159ibli\u017Eov\u00E1n\u00ED ke studovan\u00E9mu povrchu. Za\u0159\u00EDzen\u00ED bude slou\u017Eit ke studiu topologie povrch\u016F a jejich optick\u00FDch vlastnost\u00ED se submikrometrov\u00FDch rozli\u0161en\u00EDm. Navrhovatel\u00E9 ji\u017E zvl\u00E1dli vytvo\u0159en\u00ED n\u011Bkolika optick\u00FDch past\u00ED. Bude proto zkoum\u00E1na"@cs . "5395"^^ . . . . . "1"^^ . . . "1"^^ . . . . "3756"^^ . "Mikroskopie s lok\u00E1ln\u00ED sondou dr\u017Eenou optick\u00FDmi silami"@cs . "The objective of the project is to build up an experimental system that will employ an optically trapped probe for the measurement of the surface forces acting on the probe and for the determination of the sample topology and optical properties with subwavelength resolution. The probe can be trapped gently enough to avoid damage of sensitive objects and can be trapped inside transparent objects. This system is able to determine forces that are 2 orders of magnitude smaller (1 pN-100 pN) than the forces measured by the atomic force microscope. The detection of the trapped probe position must be carried out with high resolution (1-10 nm) so that these tiny forces could be measured. This will be done by placing a quadrant detector and a pair of detectors with pinholes near the probe image produced by an optical microscope. Monitoring the change of the spectrum emitted by an optically trapped microlaser as a function of its distance from the sample will be used as an alternative way. The"@en . "0"^^ . "Local probe microscopy with an optically trapped probe"@en .