"2012-12-31+01:00"^^ . . . . "14"^^ . . "14"^^ . . "2009-01-01+01:00"^^ . "3560"^^ . . "Experiment\u00E1ln\u00ED a teoretick\u00E1 anal\u00FDza defekt\u016F na povr\u0161\u00EDch kysli\u010Dn\u00EDk\u016F kovu a polovodi\u010D\u016F"@cs . "0"^^ . "Scanning Probe Microscopy; DFT simulations; Atomic Force Microscope; surface electronic structure; defects; atomic chemical identification"@en . "We will examine the atomic and electronic structure of selected reconstructions at metallic oxide and semiconductor surfaces with defects using both experimental SPM methods and first principles simulations. We will investigate the chemical (surface catalysis) and the physical (surface diffusion) processes on the TiO2 surface using combination of experimental and theoretical methods. Comparison between SPM images with atomic resolution will be further complemented by complex first principles calculations. The influence of surface imperfections on the electronic and atomic structure will be analysed. We will implement the Dynamical Force Microscopy in our laboratory to extend the capacity to cover fully all types of surfaces. Application of AFM to chemically identify single atoms on ionic and metal surfaces will be studied. We will study several factors affecting SPM image processes like the probe structure and the relaxations processes induced by the tip-sample interaction."@en . "Experimental and theoretical analysis of defects on metallic oxide and semiconductor surfaces."@en . "Budeme zkoumat atom\u00E1rn\u00ED a elektronovou strukturu vybran\u00FDch rekonstrukce povrch\u016F kysli\u010Dn\u00EDk\u016F kov\u016F a polovodi\u010D\u016F s defekty pomoc\u00ED jak experiment\u00E1ln\u00EDch SPM metod tak v\u00FDpo\u010Dt\u016F z prvn\u00EDch princip\u016F. Budeme studovat chemick\u00E9 (povrchov\u00E1 katal\u00FDza) a fyzik\u00E1ln\u00ED (povrchov\u00E1 dif\u016Fze) procesy na TiO2 povrchu pomoc\u00ED experiment\u00E1ln\u00EDch a teoretick\u00FDch metod. Porovn\u00E1n\u00ED mezi SPM obr\u00E1zky s atom\u00E1rn\u00EDm rozli\u0161en\u00EDm bude d\u00E1le dopln\u011Bno komplexn\u00ED teoretickou anal\u00FDzou na z\u00E1klad\u011B v\u00FDpo\u010Dt\u016F z prvn\u00EDch princip\u016F. Vliv povrchov\u00FDch defekt\u016F na elektronovou a atom\u00E1rn\u00ED strukturu povrchu bude analyzov\u00E1n. Provedeme implementaci dynamick\u00E9ho AFM v na\u0161\u00ED laborato\u0159i umo\u017E\u0148uj\u00EDc\u00ED anal\u00FDzu v\u0161ech typ\u016F porvchu. Bude zkoum\u00E1na mo\u017Enost aplikace AFM jako n\u00E1stroje pro chemickou identifikaci jednotliv\u00FDch atom\u016F na iontov\u00FDch a kovov\u00FDch povr\u0161\u00EDch. Budeme analyzovat r\u016Fzn\u00E9 faktory ovliv\u0148uj\u00EDc\u00ED SPM zobrazovac\u00ED procesy jako nap\u0159\u00EDklad struktura hrotu nebo relaxa\u010Dn\u00ED procesy vyvolan\u00E9 interakc\u00ED mezi hrotem a vzore\u010Dkem."@cs . . . . "3560"^^ . . "0"^^ . "1"^^ .