This HTML5 document contains 13 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

Prefix	IRI
rdfs	http://www.w3.org/2000/01/rdf-schema#
rdf	http://www.w3.org/1999/02/22-rdf-syntax-ns#
owl	http://www.w3.org/2002/07/owl#
nci	http://ncicb.nci.nih.gov/xml/owl/EVS/Thesaurus.owl#
xsdh	http://www.w3.org/2001/XMLSchema#

Statements

Subject Item

nci:C91923

rdf:type

owl:Class

rdfs:label

Device Electron Microscopy Evaluation Method

rdfs:subClassOf

nci:C54028

nci:A10

nci:C91965

nci:A8

nci:C91800

nci:P106

Functional Concept

nci:P108

Device Electron Microscopy Evaluation Method

nci:P207

C2984656

nci:P322

FDA

nci:P325

<n0:ComplexDefinition xmlns:n0="http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#"><n0:def-definition>Inspection of objects or surfaces requiring magnification using an electron microscope.</n0:def-definition><n0:def-source>FDA</n0:def-source></n0:ComplexDefinition>

nci:P90

<n0:ComplexTerm xmlns:n0="http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#"><n0:term-name>ELECTRON MICROSCOPY</n0:term-name><n0:term-group>PT</n0:term-group><n0:term-source>FDA</n0:term-source><n0:source-code>3287</n0:source-code></n0:ComplexTerm> <n0:ComplexTerm xmlns:n0="http://ncicb.nci.nih.gov/xml/owl/EVS/ComplexProperties.xsd#"><n0:term-name>Device Electron Microscopy Evaluation Method</n0:term-name><n0:term-group>PT</n0:term-group><n0:term-source>NCI</n0:term-source></n0:ComplexTerm>

nci:code

C91923