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Statements

Subject Item
n2:RIV%3AJ13%2F94%3A113202441%21RIV%2F1998%2FMSM%2FMSM8MD0
rdf:type
skos:Concept n14:Vysledek
dcterms:title
Residual stress in ion implanted titanium nitride studied by parallel beam glancing incidence X-ray diffraction Residual stress in ion implanted titanium nitride studied by parallel beam glancing incidence X-ray diffraction
skos:prefLabel
Residual stress in ion implanted titanium nitride studied by parallel beam glancing incidence X-ray diffraction Residual stress in ion implanted titanium nitride studied by parallel beam glancing incidence X-ray diffraction
skos:notation
RIV:J13/94:113202441!RIV/1998/MSM/MSM8MD0
n4:strany
9;14
n4:cisloPeriodika
2
n4:dodaniDat
n6:1998
n4:domaciTvurceVysledku
n10:8745552 n10:1406310
n4:druhVysledku
n11:J
n4:duvernostUdaju
n12:S
n4:entitaPredkladatele
n9:predkladatel
n4:idSjednocenehoVysledku
869687
n4:idVysledku
RIV:J13/94:113202441
n4:kontrolniKodProRIV
[DDBEAD6A6AEC]
n4:nazevZdroje
Rigaku Journal
n4:obor
n5:BM
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
5
n4:rokUplatneniVysledku
n6:1994
n4:svazekPeriodika
11
n4:tvurceVysledku
Geist, Daniel Valvoda, Václav Rafaja, David
s:issn
0913-543X
s:numberOfPages
0
n3:organizacniJednotka
11320