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Statements

Subject Item
n2:RIV%3AJ07%2F98%3A14310+36%21RIV%2F1998%2FMSM%2FMSM8G70
rdf:type
skos:Concept n14:Vysledek
dcterms:title
Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys
skos:prefLabel
Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys Ellipsometric study of fano resonance in heavily doped p-type Si and SiGe alloys
skos:notation
RIV:J07/98:14310 36!RIV/1998/MSM/MSM8G70
n4:strany
656;660
n4:cisloPeriodika
313-314
n4:dodaniDat
n5:1998
n4:domaciTvurceVysledku
n9:1834282
n4:druhVysledku
n10:J
n4:duvernostUdaju
n12:S
n4:entitaPredkladatele
n11:predkladatel
n4:idSjednocenehoVysledku
766713
n4:idVysledku
RIV:J07/98:14310 36
n4:kontrolniKodProRIV
[DE2C40A6AFC0]
n4:nazevZdroje
Thin Solid Films
n4:obor
n13:BM
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
1
n4:rokUplatneniVysledku
n5:1998
n4:svazekPeriodika
1998
n4:tvurceVysledku
Humlíček, Josef
s:issn
0040-6090
s:numberOfPages
0
n6:organizacniJednotka
14310