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Statements

Subject Item
n2:RIV%2F68407700%3A21670%2F10%3A00225784%21RIV15-MSM-21670___
rdf:type
n9:Vysledek skos:Concept
rdfs:seeAlso
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=5873803
dcterms:description
The Neutron Activation Analysis is a very sensitive method for determination of element content and composition. However, conventional methods do not provide information regarding the spatial distribution of the elements in the sample. To fulfill this need, we developed an electron imaging device with electron optics which provides element spatial distribution information based on beta-gamma coincidence. The investigated element is identified by the characteristic gamma radiation while the spatial information is obtained by the position sensitive detection of β-decay electrons. Unlike common and often invasive approaches our non-destructive method provides imaging and analysis simultaneously. This system makes use of tailor-made electron optics to select and focus coincidence electrons providing higher spatial resolution and better contrast images. For this purpose the semiconductor pixel detector Timepix is used for electron detection and is triggered by a gamma detector. In this contribution we investigate the possibility to use also the secondary electrons which are emitted from the sample surface by the primary ionizing particle crossing the surface in order to achieve higher efficiency of the device. These surface produced low-energy electrons are extracted and accelerated by a high voltage static field to be consequently detected by the Timepix detector. The low initial energy of the ejected electrons causes that the secondary electrons onto the Timepix sensor are monoenergetic with energy given by high voltage field. The Neutron Activation Analysis is a very sensitive method for determination of element content and composition. However, conventional methods do not provide information regarding the spatial distribution of the elements in the sample. To fulfill this need, we developed an electron imaging device with electron optics which provides element spatial distribution information based on beta-gamma coincidence. The investigated element is identified by the characteristic gamma radiation while the spatial information is obtained by the position sensitive detection of β-decay electrons. Unlike common and often invasive approaches our non-destructive method provides imaging and analysis simultaneously. This system makes use of tailor-made electron optics to select and focus coincidence electrons providing higher spatial resolution and better contrast images. For this purpose the semiconductor pixel detector Timepix is used for electron detection and is triggered by a gamma detector. In this contribution we investigate the possibility to use also the secondary electrons which are emitted from the sample surface by the primary ionizing particle crossing the surface in order to achieve higher efficiency of the device. These surface produced low-energy electrons are extracted and accelerated by a high voltage static field to be consequently detected by the Timepix detector. The low initial energy of the ejected electrons causes that the secondary electrons onto the Timepix sensor are monoenergetic with energy given by high voltage field.
dcterms:title
Non-contact imaging with enhanced spatial resolution by secondary electron detection Non-contact imaging with enhanced spatial resolution by secondary electron detection
skos:prefLabel
Non-contact imaging with enhanced spatial resolution by secondary electron detection Non-contact imaging with enhanced spatial resolution by secondary electron detection
skos:notation
RIV/68407700:21670/10:00225784!RIV15-MSM-21670___
n3:aktivita
n16:Z n16:P
n3:aktivity
P(LA08015), P(LC06041), Z(MSM6840770040)
n3:dodaniDat
n5:2015
n3:domaciTvurceVysledku
n7:5310962 n7:2321017 n7:1338226
n3:druhVysledku
n6:D
n3:duvernostUdaju
n17:S
n3:entitaPredkladatele
n15:predkladatel
n3:idSjednocenehoVysledku
274986
n3:idVysledku
RIV/68407700:21670/10:00225784
n3:jazykVysledku
n24:eng
n3:klicovaSlova
neutron activation analysis; Timepix; pixel detectors; electron optics; beta-gamma coincidence; secondary electrons
n3:klicoveSlovo
n8:pixel%20detectors n8:secondary%20electrons n8:beta-gamma%20coincidence n8:neutron%20activation%20analysis n8:electron%20optics n8:Timepix
n3:kontrolniKodProRIV
[AAB2902455BA]
n3:mistoKonaniAkce
Knoxville (Tennessee)
n3:mistoVydani
Piscataway (New Jersey)
n3:nazevZdroje
2010 IEEE Nuclear Science Symposium Conference Record (NSS/MIC)
n3:obor
n11:BG
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n19:LC06041 n19:LA08015
n3:rokUplatneniVysledku
n5:2010
n3:tvurceVysledku
Krejčí, František Kroupa, Martin Jakůbek, Jan
n3:typAkce
n20:WRD
n3:wos
000306402900098
n3:zahajeniAkce
2010-10-30+02:00
n3:zamer
n23:MSM6840770040
s:issn
1095-7863
s:numberOfPages
2
n22:doi
10.1109/NSSMIC.2010.5873803
n21:hasPublisher
IEEE
n14:isbn
978-1-4244-9106-3
n12:organizacniJednotka
21670