This HTML5 document contains 49 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n23http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n14http://purl.org/net/nknouf/ns/bibtex#
n9http://localhost/temp/predkladatel/
n22http://linked.opendata.cz/resource/domain/vavai/projekt/
n4http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n21http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F68407700%3A21460%2F14%3A00222715%21RIV15-MV0-21460___/
n17http://linked.opendata.cz/ontology/domain/vavai/
n10https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
rdfshttp://www.w3.org/2000/01/rdf-schema#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n15http://bibframe.org/vocab/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n8http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n13http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n6http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n7http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n5http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F68407700%3A21460%2F14%3A00222715%21RIV15-MV0-21460___
rdf:type
skos:Concept n17:Vysledek
rdfs:seeAlso
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7018313
dcterms:description
The most frequently used method for scratch test in the international standards is progressive loading scratch test mode. Although the mentioned standards to measure practical adhesion of nano and micro thin films require optical microscope with magnifications between 100x and 500x, not only the optical microscopes, but even the international standards are not usually and largely used to study new biocompatible thin films. The authors designed a method and a custom-written program for the measurement and evaluation of scratches using digital microscope and digital microscope image analysis, which is based on the requirements of international standards for the determination of critical normal forces and capabilities of existing scratch testers. The proposed procedure and software were tested on the samples of TiN, Au, Pt and Pd biocompatible nano-thin layers. Delamination or loss of adhesion was observed in all cases, and two types of critical normal forces were determined. It was found that the calculated critical normal forces are largely similar in the three operations of the measurement of a sample. Thus, evaluation using critical scratch loads measured by three test operations seems to be sufficient. The new software and procedures allow us to evaluate the practical adhesions of a wide range of substrate and thin film materials, and gave us credible results. The most frequently used method for scratch test in the international standards is progressive loading scratch test mode. Although the mentioned standards to measure practical adhesion of nano and micro thin films require optical microscope with magnifications between 100x and 500x, not only the optical microscopes, but even the international standards are not usually and largely used to study new biocompatible thin films. The authors designed a method and a custom-written program for the measurement and evaluation of scratches using digital microscope and digital microscope image analysis, which is based on the requirements of international standards for the determination of critical normal forces and capabilities of existing scratch testers. The proposed procedure and software were tested on the samples of TiN, Au, Pt and Pd biocompatible nano-thin layers. Delamination or loss of adhesion was observed in all cases, and two types of critical normal forces were determined. It was found that the calculated critical normal forces are largely similar in the three operations of the measurement of a sample. Thus, evaluation using critical scratch loads measured by three test operations seems to be sufficient. The new software and procedures allow us to evaluate the practical adhesions of a wide range of substrate and thin film materials, and gave us credible results.
dcterms:title
Evaluation of the Adhesion Strength using Digital Microscope and International Standards Evaluation of the Adhesion Strength using Digital Microscope and International Standards
skos:prefLabel
Evaluation of the Adhesion Strength using Digital Microscope and International Standards Evaluation of the Adhesion Strength using Digital Microscope and International Standards
skos:notation
RIV/68407700:21460/14:00222715!RIV15-MV0-21460___
n3:aktivita
n13:S n13:P
n3:aktivity
P(VG20102015002), S
n3:dodaniDat
n5:2015
n3:domaciTvurceVysledku
n4:5324866 n4:3896919 Socha, Vladimír
n3:druhVysledku
n7:D
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n21:predkladatel
n3:idSjednocenehoVysledku
15461
n3:idVysledku
RIV/68407700:21460/14:00222715
n3:jazykVysledku
n6:eng
n3:klicovaSlova
adhesive strength; optical microscopy; image analysis; materials testing; force measurement
n3:klicoveSlovo
n8:force%20measurement n8:image%20analysis n8:optical%20microscopy n8:materials%20testing n8:adhesive%20strength
n3:kontrolniKodProRIV
[5B726807DE79]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Brno
n3:nazevZdroje
16th Mechatronika 2014
n3:obor
n16:JJ
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
4
n3:projekt
n22:VG20102015002
n3:rokUplatneniVysledku
n5:2014
n3:tvurceVysledku
Socha, Vladimír Kutílek, Patrik Smrčka, Pavel Fitl, P.
n3:typAkce
n23:EUR
n3:zahajeniAkce
2014-12-03+01:00
s:numberOfPages
7
n15:doi
10.1109/MECHATRONIKA.2014.7018313
n14:hasPublisher
Vysoké učení technické v Brně
n10:isbn
978-80-214-4816-2
n9:organizacniJednotka
21460