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Statements

Subject Item
n2:RIV%2F68407700%3A21460%2F07%3A12130223%21RIV08-AV0-21460___
rdf:type
n15:Vysledek skos:Concept
dcterms:description
A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+-7.5) nm and ~2 mJ.cm-2, respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at um resolution by a method developed here. Není k dispozici A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda<100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly (methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9+-7.5) nm and ~2 mJ.cm-2, respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at um resolution by a method developed here.
dcterms:title
Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids
skos:prefLabel
Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids Characteristics of Focused Soft X-Ray Free-Electron Laser Beam Determined by Ablation Of Organic Molecular Solids
skos:notation
RIV/68407700:21460/07:12130223!RIV08-AV0-21460___
n4:strany
6036;6043
n4:aktivita
n7:P n7:Z
n4:aktivity
P(1P04LA235), P(KAN300100702), P(LC510), P(LC528), Z(AV0Z10100523), Z(AV0Z40400503)
n4:cisloPeriodika
10
n4:dodaniDat
n14:2008
n4:domaciTvurceVysledku
n10:2712679 n10:8442037
n4:druhVysledku
n9:J
n4:duvernostUdaju
n19:S
n4:entitaPredkladatele
n16:predkladatel
n4:idSjednocenehoVysledku
413316
n4:idVysledku
RIV/68407700:21460/07:12130223
n4:jazykVysledku
n13:eng
n4:klicovaSlova
X-ray laser
n4:klicoveSlovo
n11:X-ray%20laser
n4:kodStatuVydavatele
US - Spojené státy americké
n4:kontrolniKodProRIV
[09F952157376]
n4:nazevZdroje
Optics Express
n4:obor
n18:BH
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
29
n4:projekt
n8:1P04LA235 n8:KAN300100702 n8:LC528 n8:LC510
n4:rokUplatneniVysledku
n14:2007
n4:svazekPeriodika
15
n4:tvurceVysledku
Jurek, M. Toleikis, S. Koptyaev, S. Sobierajski, R. Caleman, C. London, R. A. Pelka, J. B. Tschentscher, T. Chalupský, Jaromír Velyhan, A. Krasa, J. Tronnier, A. Cihelka, J. Meyer-ter-Vehn, J. Tiedtke, K. Bergh, M. Sokolowski-Tinten, K. Juha, L. Bionta, R. M. Hajkova, V. Wabnitz, H. Zastrau, U. Chapman, H. Stojanovic, N. Kuba, Jaroslav Nietubyc, J. Hajdu, J. Krzywinski, J. Hau-Riege, S. P.
n4:zamer
n5:AV0Z40400503 n5:AV0Z10100523
s:issn
1094-4087
s:numberOfPages
8
n17:organizacniJednotka
21460