This HTML5 document contains 41 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
dctermshttp://purl.org/dc/terms/
n4http://localhost/temp/predkladatel/
n19http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n14http://linked.opendata.cz/resource/domain/vavai/subjekt/
n11http://linked.opendata.cz/ontology/domain/vavai/riv/uzemniOchranaPatentu/
n13http://linked.opendata.cz/ontology/domain/vavai/
n5http://linked.opendata.cz/resource/domain/vavai/zamer/
rdfshttp://www.w3.org/2000/01/rdf-schema#
skoshttp://www.w3.org/2004/02/skos/core#
n22http://linked.opendata.cz/ontology/domain/vavai/riv/vyuzitiPatentuVzoru/
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n20http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F68407700%3A21340%2F12%3A00193957%21RIV13-MSM-21340___/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/licencniPoplatek/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n12http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n7http://linked.opendata.cz/ontology/domain/vavai/riv/vyuzitiJinymSubjektem/
n9http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n21http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n23http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n10http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n8http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F68407700%3A21340%2F12%3A00193957%21RIV13-MSM-21340___
rdf:type
skos:Concept n13:Vysledek
rdfs:seeAlso
https://data.epo.org/publication-server/rest/v1.0/publication-dates/20120606/patents/EP2168130NWB1/document.pdf
dcterms:description
Presented solution deals with an X-ray optical element suitable in particular for X-ray microscopy and other X-ray-based display systems. Disadvantages of known setups are improved by an optical set-up exploiting a monocrystal, which displays X-ray radiation with wavelength λ according to the presented solution. This set-up consists of at least one monocrystal with atomic planes in parallel with optical axis, it means with a line connecting the point to be displayed with the center of its image. Presented solution deals with an X-ray optical element suitable in particular for X-ray microscopy and other X-ray-based display systems. Disadvantages of known setups are improved by an optical set-up exploiting a monocrystal, which displays X-ray radiation with wavelength λ according to the presented solution. This set-up consists of at least one monocrystal with atomic planes in parallel with optical axis, it means with a line connecting the point to be displayed with the center of its image.
dcterms:title
Optical Element for X-ray Microscopy Optical Element for X-ray Microscopy
skos:prefLabel
Optical Element for X-ray Microscopy Optical Element for X-ray Microscopy
skos:notation
RIV/68407700:21340/12:00193957!RIV13-MSM-21340___
n13:predkladatel
n14:orjk%3A21340
n3:aktivita
n15:Z
n3:aktivity
Z(MSM6840770039)
n3:cisloPatentuVzoru
EP2168130
n3:datumUdeleniPatentuVzoru
2012-06-06+02:00
n3:dodaniDat
n8:2013
n3:domaciTvurceVysledku
n19:8478384
n3:druhVysledku
n23:P
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n20:predkladatel
n3:idSjednocenehoVysledku
156733
n3:idVysledku
RIV/68407700:21340/12:00193957
n3:jazykVysledku
n21:eng
n3:klicovaSlova
X-ray microscopy
n3:klicoveSlovo
n12:X-ray%20microscopy
n3:kontrolniKodProRIV
[7F29EFE9345D]
n3:licencniPoplatek
n16:Z
n3:mistoVydaniPatentuVzoru
Munich, The Hague, Berlin, Vienna, Brussels
n3:nazevVydavatelePatentuVzoru
Evropský patentový úřad
n3:obor
n10:BH
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:rokUplatneniVysledku
n8:2012
n3:tvurceVysledku
Chadzitaskos, Goce
n3:uzemniOchranaPatentu
n11:A
n3:vlastnik
n20:vlastnikVysledku
n3:vyuzitiJinymSubjektem
n7:P
n3:vyuzitiPatentuVzoru
n22:A
n3:zamer
n5:MSM6840770039
n3:vlastnikPatentuVzoru
České vysoké učení technické v Praze, Fakulta jaderná a fyzikálně-inženýrská
n4:organizacniJednotka
21340