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Statements

Subject Item
n2:RIV%2F68407700%3A21340%2F11%3A00188192%21RIV12-MSM-21340___
rdf:type
n5:Vysledek skos:Concept
dcterms:description
Silver is widely used for fabrication of plasmonic devices because of its unique optical constants. The nanostructure of the Ag layer is mainly influenced during the initial stage of the silver nucleation. Therefore, we focus our attention on studying this stage of silver growth. Nanostructured ultrathin silver layers are prepared by means of magnetron sputtering. The initial stage of the nucleation and the layer growth is studied by optical monitoring, which is based on spectrophotometric measurement of the sample reflectivity. The measured data are compared to a model of layered structure. The noncontinual (Volmer-Weber) mode of the layer nucleation is clearly distinguished in the monitored data. Thus, we are able to estimate the point of noncontinual layer coalescence. The optical data are correlated with in situ monitoring of the electrical resistance. We find that the nucleation mode and resulting nanostructure can be significantly influenced by an ultrathin silver oxide interlaye Silver is widely used for fabrication of plasmonic devices because of its unique optical constants. The nanostructure of the Ag layer is mainly influenced during the initial stage of the silver nucleation. Therefore, we focus our attention on studying this stage of silver growth. Nanostructured ultrathin silver layers are prepared by means of magnetron sputtering. The initial stage of the nucleation and the layer growth is studied by optical monitoring, which is based on spectrophotometric measurement of the sample reflectivity. The measured data are compared to a model of layered structure. The noncontinual (Volmer-Weber) mode of the layer nucleation is clearly distinguished in the monitored data. Thus, we are able to estimate the point of noncontinual layer coalescence. The optical data are correlated with in situ monitoring of the electrical resistance. We find that the nucleation mode and resulting nanostructure can be significantly influenced by an ultrathin silver oxide interlaye
dcterms:title
Preparation of nanostructured ultra thin silver layer Preparation of nanostructured ultra thin silver layer
skos:prefLabel
Preparation of nanostructured ultra thin silver layer Preparation of nanostructured ultra thin silver layer
skos:notation
RIV/68407700:21340/11:00188192!RIV12-MSM-21340___
n5:predkladatel
n14:orjk%3A21340
n3:aktivita
n15:S
n3:aktivity
S
n3:dodaniDat
n13:2012
n3:domaciTvurceVysledku
Lynnyk, Anna
n3:druhVysledku
n12:O
n3:duvernostUdaju
n8:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
223093
n3:idVysledku
RIV/68407700:21340/11:00188192
n3:jazykVysledku
n4:eng
n3:klicovaSlova
ultrathin silver layers; growth monitoring; optical properties
n3:klicoveSlovo
n7:ultrathin%20silver%20layers n7:growth%20monitoring n7:optical%20properties
n3:kontrolniKodProRIV
[38C05D547895]
n3:obor
n11:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
4
n3:rokUplatneniVysledku
n13:2011
n3:tvurceVysledku
Novotný, M. Lančok, J. Lynnyk, Anna Bulıř, J.
n9:organizacniJednotka
21340