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Statements

Subject Item
n2:RIV%2F68407700%3A21340%2F11%3A00176190%21RIV12-MSM-21340___
rdf:type
skos:Concept n3:Vysledek
dcterms:description
Optical properties of PbZrxTi1 - xO3 material have been actively studied in the visible and near band-gap region, but data in the vacuum-ultraviolet spectral region is rather scarce. In this work we focus on well known interband transitions for the perovskite materials, 2p -> dγ, located in VUV spectral region. Dielectric functions of chemical solution deposited and sputtered PZT were obtained in the spectral range 1-8.8 eV. Differences between the absorption maxima for chemical solution deposited and sputtered PbZrxTi1 - xO3 samples near Kahn-Leyendecker 2p -> dγ interband transition were found and are interpreted by change of interatomic distances. This is confirmed by different lattice constants. In the case of PbZrxTi1 - xO3 film with microcracks, the void fraction was estimated from the effective medium approximation. Direct band-gap energies appear to be nearly the same for all reactive sputtered samples weakly depending of Zr/Ti Optical properties of PbZrxTi1 - xO3 material have been actively studied in the visible and near band-gap region, but data in the vacuum-ultraviolet spectral region is rather scarce. In this work we focus on well known interband transitions for the perovskite materials, 2p -> dγ, located in VUV spectral region. Dielectric functions of chemical solution deposited and sputtered PZT were obtained in the spectral range 1-8.8 eV. Differences between the absorption maxima for chemical solution deposited and sputtered PbZrxTi1 - xO3 samples near Kahn-Leyendecker 2p -> dγ interband transition were found and are interpreted by change of interatomic distances. This is confirmed by different lattice constants. In the case of PbZrxTi1 - xO3 film with microcracks, the void fraction was estimated from the effective medium approximation. Direct band-gap energies appear to be nearly the same for all reactive sputtered samples weakly depending of Zr/Ti
dcterms:title
Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films
skos:prefLabel
Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films
skos:notation
RIV/68407700:21340/11:00176190!RIV12-MSM-21340___
n3:predkladatel
n4:orjk%3A21340
n5:aktivita
n6:S
n5:aktivity
S
n5:dodaniDat
n10:2012
n5:domaciTvurceVysledku
Lynnyk, Anna
n5:druhVysledku
n16:O
n5:duvernostUdaju
n15:S
n5:entitaPredkladatele
n14:predkladatel
n5:idSjednocenehoVysledku
237800
n5:idVysledku
RIV/68407700:21340/11:00176190
n5:jazykVysledku
n13:eng
n5:klicovaSlova
PZT film; Vacuum-ultraviolet ellipsometry; Film structure; Optical properties
n5:klicoveSlovo
n7:Vacuum-ultraviolet%20ellipsometry n7:Film%20structure n7:PZT%20film n7:Optical%20properties
n5:kontrolniKodProRIV
[DCD1355D67D6]
n5:obor
n12:BM
n5:pocetDomacichTvurcuVysledku
1
n5:pocetTvurcuVysledku
5
n5:rokUplatneniVysledku
n10:2011
n5:tvurceVysledku
Železný, V. Kousal, J. Lynnyk, Anna Chvostová, D. Suchaneck, G.
n9:organizacniJednotka
21340