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Statements

Subject Item
n2:RIV%2F68407700%3A21340%2F03%3A04092499%21RIV%2F2004%2FMSM%2F213404%2FN
rdf:type
n6:Vysledek skos:Concept
dcterms:description
Fourier Transform Photocurrent Spectroscopy (FTPS) has been used for a fast and sensitive quality assessment of photovoltaic thin films, such as the microcrystalline silicon. Because the properties of this material strongly depend on the substrate used, we demonstrate here how to utilize the FTPS for measurement of films grown on conductive TCO covered glass substrate, as it is the case of solar cells. Further, we have studied homogeneity of the optoelectronic properties of layers over large areas (30x30 cm2) and for one case correlated the results with the cell efficiency over the area. Moreover, we show a possibility to interpret the FTPS data on cells as the quantum efficiency (spectral response) measurement and to extend the measuring range from near IR over the whole visible region. Fourier Transform Photocurrent Spectroscopy (FTPS) has been used for a fast and sensitive quality assessment of photovoltaic thin films, such as the microcrystalline silicon. Because the properties of this material strongly depend on the substrate used, we demonstrate here how to utilize the FTPS for measurement of films grown on conductive TCO covered glass substrate, as it is the case of solar cells. Further, we have studied homogeneity of the optoelectronic properties of layers over large areas (30x30 cm2) and for one case correlated the results with the cell efficiency over the area. Moreover, we show a possibility to interpret the FTPS data on cells as the quantum efficiency (spectral response) measurement and to extend the measuring range from near IR over the whole visible region.
dcterms:title
Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure
skos:prefLabel
Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure Fast and Sensitive Defect Characterisation and Spectral Response Measurement of Thin Film Silicon Solar Structure
skos:notation
RIV/68407700:21340/03:04092499!RIV/2004/MSM/213404/N
n3:strany
146 ; 146
n3:aktivita
n19:Z
n3:aktivity
Z(MSM 210000022)
n3:dodaniDat
n8:2004
n3:domaciTvurceVysledku
n7:4025326
n3:druhVysledku
n11:D
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n5:predkladatel
n3:idSjednocenehoVysledku
607094
n3:idVysledku
RIV/68407700:21340/03:04092499
n3:jazykVysledku
n10:eng
n3:klicovaSlova
Fourier Transform Photocurrent Spectroscopy,transparent conductive oxide
n3:klicoveSlovo
n15:Fourier%20Transform%20Photocurrent%20Spectroscopy n15:transparent%20conductive%20oxide
n3:kontrolniKodProRIV
[5A8EE0E39DA4]
n3:mistoKonaniAkce
Osaka
n3:mistoVydani
Osaka
n3:nazevZdroje
Abstract Book of the 3rd World Conference of Photovoltaic Energy Conversion
n3:obor
n9:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
9
n3:rokUplatneniVysledku
n8:2003
n3:tvurceVysledku
Shah, A. Wyrsch, N. Müllerová, Lenka Poruba, A. Rech, B. Vaněček, M. Špringer, J. Repmann, T. Kundig, J.
n3:typAkce
n13:WRD
n3:zahajeniAkce
2003-05-11+02:00
n3:zamer
n18:MSM%20210000022
s:numberOfPages
1
n17:hasPublisher
ILE, Osaka University
n20:organizacniJednotka
21340