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Statements

Subject Item
n2:RIV%2F68407700%3A21230%2F13%3A00213246%21RIV14-MSM-21230___
rdf:type
skos:Concept n18:Vysledek
dcterms:description
A new microwave method capable of contactless thickness measurement of metal sheets with high resolution has been proposed. First experimental results in X-band are reported. The method is based on precise interferometric phase evaluation of a signal reflected step by step from two surfaces of a metal sheet whose thickness is to be measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected. A new microwave method capable of contactless thickness measurement of metal sheets with high resolution has been proposed. First experimental results in X-band are reported. The method is based on precise interferometric phase evaluation of a signal reflected step by step from two surfaces of a metal sheet whose thickness is to be measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected.
dcterms:title
Microwave interferometric method for metal sheet thickness measurement Microwave interferometric method for metal sheet thickness measurement
skos:prefLabel
Microwave interferometric method for metal sheet thickness measurement Microwave interferometric method for metal sheet thickness measurement
skos:notation
RIV/68407700:21230/13:00213246!RIV14-MSM-21230___
n18:predkladatel
n19:orjk%3A21230
n4:aktivita
n13:I
n4:aktivity
I
n4:dodaniDat
n20:2014
n4:domaciTvurceVysledku
n21:9945288
n4:druhVysledku
n8:D
n4:duvernostUdaju
n16:S
n4:entitaPredkladatele
n11:predkladatel
n4:idSjednocenehoVysledku
88258
n4:idVysledku
RIV/68407700:21230/13:00213246
n4:jazykVysledku
n10:eng
n4:klicovaSlova
Contact less; High resolution; Interferometric methods; Interferometric phase; Microwave methods; Reference signals; Sheet thickness
n4:klicoveSlovo
n6:Interferometric%20methods n6:Interferometric%20phase n6:Sheet%20thickness n6:Reference%20signals n6:Microwave%20methods n6:Contact%20less n6:High%20resolution
n4:kontrolniKodProRIV
[BBB4996DB384]
n4:mistoKonaniAkce
Seattle
n4:mistoVydani
New Jersey
n4:nazevZdroje
81st ARFTG Microwave Measurement Conference Proceedings
n4:obor
n14:JB
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
2
n4:rokUplatneniVysledku
n20:2013
n4:tvurceVysledku
Škvor, Zbyněk Hoffmann, Karel
n4:typAkce
n12:WRD
n4:wos
000333388300017
n4:zahajeniAkce
2013-06-03+02:00
s:numberOfPages
3
n17:doi
10.1109/ARFTG.2013.6579036
n22:hasPublisher
IEEE
n15:isbn
978-1-4673-4982-6
n9:organizacniJednotka
21230