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Statements

Subject Item
n2:RIV%2F68407700%3A21230%2F12%3A00204620%21RIV13-MSM-21230___
rdf:type
n5:Vysledek skos:Concept
rdfs:seeAlso
http://147.228.94.30/index.php?option=com_content&view=article&id=356:esd-mosfet-model-calibration-by-differential-evolutionary-optimization-algorithm&catid=42:cislo-62012-eds-2012&Itemid=49
dcterms:description
The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the measured data from test chip to the appropriate electrostatic discharge (ESD) model without the need of manual model-parameters tuning. In contrast with proposed method the traditional approach can be very time and resource consuming. To the best knowledge of the authors, this novel approach has never been previously used. Short introduction to ESD NMOST function and properties are presented along with basic overview of differential evolutionary optimization algorithm. Results of fitting the technology-optimized macro-model of NMOST to the simple piece-wise linear model of MOSFET snapback I-V characteristic will be presented. The aim of this paper is to present the utilization of modern optimization algorithm called Differential Evolution to automatically fit the measured data from test chip to the appropriate electrostatic discharge (ESD) model without the need of manual model-parameters tuning. In contrast with proposed method the traditional approach can be very time and resource consuming. To the best knowledge of the authors, this novel approach has never been previously used. Short introduction to ESD NMOST function and properties are presented along with basic overview of differential evolutionary optimization algorithm. Results of fitting the technology-optimized macro-model of NMOST to the simple piece-wise linear model of MOSFET snapback I-V characteristic will be presented.
dcterms:title
ESD MOSFET model calibration by differential evolutionary optimization algorithm ESD MOSFET model calibration by differential evolutionary optimization algorithm
skos:prefLabel
ESD MOSFET model calibration by differential evolutionary optimization algorithm ESD MOSFET model calibration by differential evolutionary optimization algorithm
skos:notation
RIV/68407700:21230/12:00204620!RIV13-MSM-21230___
n5:predkladatel
n10:orjk%3A21230
n3:aktivita
n16:S
n3:aktivity
S
n3:cisloPeriodika
6
n3:dodaniDat
n6:2013
n3:domaciTvurceVysledku
n14:9075909 n14:7043104
n3:druhVysledku
n15:J
n3:duvernostUdaju
n19:S
n3:entitaPredkladatele
n12:predkladatel
n3:idSjednocenehoVysledku
134723
n3:idVysledku
RIV/68407700:21230/12:00204620
n3:jazykVysledku
n9:eng
n3:klicovaSlova
ESD modeling; MOSFET; differential evolution; model calibration; curve fitting
n3:klicoveSlovo
n8:curve%20fitting n8:model%20calibration n8:MOSFET n8:ESD%20modeling n8:differential%20evolution
n3:kodStatuVydavatele
CZ - Česká republika
n3:kontrolniKodProRIV
[B25C8966D179]
n3:nazevZdroje
ElectroScope
n3:obor
n13:JA
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:rokUplatneniVysledku
n6:2012
n3:svazekPeriodika
2012
n3:tvurceVysledku
Nápravník, Tomáš Jakovenko, Jiří
s:issn
1802-4564
s:numberOfPages
7
n18:organizacniJednotka
21230