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Statements

Subject Item
n2:RIV%2F68407700%3A21230%2F10%3A00167965%21RIV11-GA0-21230___
rdf:type
skos:Concept n21:Vysledek
dcterms:description
This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 kΩ up to 330 kΩ. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values. This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 kΩ up to 330 kΩ. A novel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values.
dcterms:title
Measurement of Extreme Impedances Measurement of Extreme Impedances
skos:prefLabel
Measurement of Extreme Impedances Measurement of Extreme Impedances
skos:notation
RIV/68407700:21230/10:00167965!RIV11-GA0-21230___
n3:aktivita
n4:P n4:Z
n3:aktivity
P(GD102/08/H027), Z(MSM6840770015)
n3:dodaniDat
n6:2011
n3:domaciTvurceVysledku
n12:7403593 n12:9945288
n3:druhVysledku
n13:D
n3:duvernostUdaju
n20:S
n3:entitaPredkladatele
n15:predkladatel
n3:idSjednocenehoVysledku
270009
n3:idVysledku
RIV/68407700:21230/10:00167965
n3:jazykVysledku
n11:eng
n3:klicovaSlova
calibration; impedance measurement; microwave circuits; microwave measurements; nanotechnology
n3:klicoveSlovo
n14:microwave%20circuits n14:microwave%20measurements n14:impedance%20measurement n14:calibration n14:nanotechnology
n3:kontrolniKodProRIV
[63A8CF31FCE8]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Brno
n3:nazevZdroje
Proceedings of 15th Conference on Microwave Techniques COMITE 2010
n3:obor
n8:JA
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n10:GD102%2F08%2FH027
n3:rokUplatneniVysledku
n6:2010
n3:tvurceVysledku
Hoffmann, Karel Randus, Martin
n3:typAkce
n16:EUR
n3:zahajeniAkce
2010-04-19+02:00
n3:zamer
n7:MSM6840770015
s:numberOfPages
4
n22:hasPublisher
Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav radioelektroniky
n18:isbn
978-1-4244-6351-0
n19:organizacniJednotka
21230