This HTML5 document contains 47 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n7http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n19http://purl.org/net/nknouf/ns/bibtex#
n12http://localhost/temp/predkladatel/
n17http://linked.opendata.cz/resource/domain/vavai/projekt/
n10http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n22http://linked.opendata.cz/ontology/domain/vavai/
n21https://schema.org/
n5http://linked.opendata.cz/resource/domain/vavai/zamer/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n6http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F68407700%3A21230%2F07%3A03131080%21RIV08-GA0-21230___/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n9http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n4http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n20http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n13http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n14http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n11http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F68407700%3A21230%2F07%3A03131080%21RIV08-GA0-21230___
rdf:type
skos:Concept n22:Vysledek
dcterms:description
The optimization is an indispensable tool for extracting the parameters of any complicated models. Hence, advanced optimization techniques are also necessary for identifying the model parameters of semiconductor devices because their current models are very sophisticated (especially the BJT and MOSFET ones). The equations of such models contain typically one hundred parameters. Therefore, the measurement and particularly identification of the full set of the model parameters is very difficult. In the paper, an optimization method is presented which is applicable for the identifications of very complicated models using a relatively small number of iterations. The algorithm has been implemented into the original software tool C.I.A. (Circuit Interactive Analyzer) to its static and dynamic analysis modes. Therefore, the optimization is able to identify both direct-current and capacitance models of semiconductor devices. The process is demonstrated with various transistors. The optimization is an indispensable tool for extracting the parameters of any complicated models. Hence, advanced optimization techniques are also necessary for identifying the model parameters of semiconductor devices because their current models are very sophisticated (especially the BJT and MOSFET ones). The equations of such models contain typically one hundred parameters. Therefore, the measurement and particularly identification of the full set of the model parameters is very difficult. In the paper, an optimization method is presented which is applicable for the identifications of very complicated models using a relatively small number of iterations. The algorithm has been implemented into the original software tool C.I.A. (Circuit Interactive Analyzer) to its static and dynamic analysis modes. Therefore, the optimization is able to identify both direct-current and capacitance models of semiconductor devices. The process is demonstrated with various transistors. Identifikace parametrů modelů polovodičových prvků užitím optimalizačních metod.
dcterms:title
Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques Identifikace parametrů modelů polovodičových prvků užitím optimalizačních metod Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques
skos:prefLabel
Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques Identifying Model Parameters of Semiconductor Devices Using Optimization Techniques Identifikace parametrů modelů polovodičových prvků užitím optimalizačních metod
skos:notation
RIV/68407700:21230/07:03131080!RIV08-GA0-21230___
n3:strany
603;608
n3:aktivita
n20:P n20:Z
n3:aktivity
P(GA102/05/0277), Z(MSM6840770014)
n3:dodaniDat
n11:2008
n3:domaciTvurceVysledku
n10:9586814 n10:4816463 n10:5551056
n3:druhVysledku
n15:D
n3:duvernostUdaju
n4:S
n3:entitaPredkladatele
n6:predkladatel
n3:idSjednocenehoVysledku
425385
n3:idVysledku
RIV/68407700:21230/07:03131080
n3:jazykVysledku
n13:eng
n3:klicovaSlova
model parameters
n3:klicoveSlovo
n9:model%20parameters
n3:kontrolniKodProRIV
[81F691B3FE86]
n3:mistoKonaniAkce
Cavtat
n3:mistoVydani
Zagreb
n3:nazevZdroje
Proceedings of the ITI 2007 29th International Conference on Information Technology Interfaces
n3:obor
n14:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n17:GA102%2F05%2F0277
n3:rokUplatneniVysledku
n11:2007
n3:tvurceVysledku
Dobeš, Josef Grábner, Martin Hruškovič, Ľubomír
n3:typAkce
n7:WRD
n3:zahajeniAkce
2007-06-25+02:00
n3:zamer
n5:MSM6840770014
s:numberOfPages
6
n19:hasPublisher
SRCE University of Zagreb
n21:isbn
978-953-7138-09-7
n12:organizacniJednotka
21230