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Statements

Subject Item
n2:RIV%2F68407700%3A21230%2F06%3A03125272%21RIV07-MSM-21230___
rdf:type
skos:Concept n15:Vysledek
dcterms:description
Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of the manufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz. Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of the manufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz. Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error etching technology on soft substrates. An evaluation of the error model is affected expecially with a variation of the manufacturing process and also with a reproducibillity of an assembly. In this paper, we propose error minimazation using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measuerment. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz.
dcterms:title
Vylepšené hodnocení planárních kalibračních standardů pomocí TDR předvýběrové metody Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method
skos:prefLabel
Vylepšené hodnocení planárních kalibračních standardů pomocí TDR předvýběrové metody Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method Improved Evaluation of Planar Calibration Standards Using TDR Preselection Method
skos:notation
RIV/68407700:21230/06:03125272!RIV07-MSM-21230___
n5:aktivita
n7:Z
n5:aktivity
Z(MSM6840770015)
n5:dodaniDat
n18:2007
n5:domaciTvurceVysledku
n10:2984784 n10:3493989 n10:9945288
n5:druhVysledku
n14:A
n5:duvernostUdaju
n9:S
n5:entitaPredkladatele
n13:predkladatel
n5:idSjednocenehoVysledku
479066
n5:idVysledku
RIV/68407700:21230/06:03125272
n5:jazykVysledku
n12:eng
n5:klicovaSlova
calibration standards; equivalent circuits; error correction; scattering parameters; vector network analyzer
n5:klicoveSlovo
n6:error%20correction n6:vector%20network%20analyzer n6:equivalent%20circuits n6:scattering%20parameters n6:calibration%20standards
n5:kodPristupu
n8:L
n5:kontrolniKodProRIV
[031DD211EA91]
n5:mistoVydani
Piscataway
n5:nosic
6050 140 R H 36706
n5:obor
n11:JA
n5:pocetDomacichTvurcuVysledku
3
n5:pocetTvurcuVysledku
4
n5:rokUplatneniVysledku
n18:2006
n5:tvurceVysledku
Vancl, J. Škvor, Zbyněk Hoffmann, Karel Sokol, Vratislav
n5:zamer
n17:MSM6840770015
n16:organizacniJednotka
21230