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Statements

Subject Item
n2:RIV%2F68407700%3A21230%2F05%3A03109961%21RIV06-GA0-21230___
rdf:type
skos:Concept n18:Vysledek
dcterms:description
Není k dispozici During a pseudo-random testing of combinational circuits the pattern generator produces test vectors that are being applied to the tested circuit. The nature of the generator thus directly influences the fault coverage achieved. We discuss an influence of the type of the pseudo-random pattern generator on the fault coverage. In most cases a linear feedback shift register (LFSR) is used as a test pattern generator, while its generating polynomial is primitive to ensure a maximal period. We show that it is not necessary to use primitive polynomials, and moreover that their using is even undesirable in most cases. The observations are documented by statistical results. During a pseudo-random testing of combinational circuits the pattern generator produces test vectors that are being applied to the tested circuit. The nature of the generator thus directly influences the fault coverage achieved. We discuss an influence of the type of the pseudo-random pattern generator on the fault coverage. In most cases a linear feedback shift register (LFSR) is used as a test pattern generator, while its generating polynomial is primitive to ensure a maximal period. We show that it is not necessary to use primitive polynomials, and moreover that their using is even undesirable in most cases. The observations are documented by statistical results.
dcterms:title
Pseudorandom Testability - Study of the Effect of the Generator Type Pseudorandom Testability - Study of the Effect of the Generator Type Není k dispozici
skos:prefLabel
Pseudorandom Testability - Study of the Effect of the Generator Type Pseudorandom Testability - Study of the Effect of the Generator Type Není k dispozici
skos:notation
RIV/68407700:21230/05:03109961!RIV06-GA0-21230___
n3:strany
47 ; 54
n3:aktivita
n11:Z n11:P
n3:aktivity
P(GA102/04/2137), Z(MSM6840770014)
n3:cisloPeriodika
2
n3:dodaniDat
n7:2006
n3:domaciTvurceVysledku
n6:2194937 n6:7140827
n3:druhVysledku
n14:J
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n12:predkladatel
n3:idSjednocenehoVysledku
539587
n3:idVysledku
RIV/68407700:21230/05:03109961
n3:jazykVysledku
n13:eng
n3:klicovaSlova
buitl-in self-test, diagnostics, testability, LFSR, test-pattern generator, column matching
n3:klicoveSlovo
n4:buitl-in%20self-test n4:LFSR n4:test-pattern%20generator n4:testability n4:column%20matching n4:diagnostics
n3:kodStatuVydavatele
CZ - Česká republika
n3:kontrolniKodProRIV
[A772FAE3C635]
n3:nazevZdroje
Acta Polytechnica
n3:obor
n8:JC
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n19:GA102%2F04%2F2137
n3:rokUplatneniVysledku
n7:2005
n3:svazekPeriodika
45
n3:tvurceVysledku
Kubátová, Hana Fišer, Petr
n3:zamer
n15:MSM6840770014
s:issn
1210-2709
s:numberOfPages
8
n16:organizacniJednotka
21230