This HTML5 document contains 48 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n7http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n11http://localhost/temp/predkladatel/
n5http://purl.org/net/nknouf/ns/bibtex#
n22http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n18http://linked.opendata.cz/resource/domain/vavai/projekt/
n14http://linked.opendata.cz/ontology/domain/vavai/
n20http://linked.opendata.cz/resource/domain/vavai/zamer/
n10https://schema.org/
n17http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F68407700%3A21230%2F04%3A03100099%21RIV%2F2005%2FGA0%2F212305%2FN/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n8http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n21http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n15http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n4http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n9http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n13http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F68407700%3A21230%2F04%3A03100099%21RIV%2F2005%2FGA0%2F212305%2FN
rdf:type
skos:Concept n14:Vysledek
dcterms:description
Není k dispozici In this paper we present a discussion on choosing the test lengths in our mixed-mode BIST technique. The BIST design method is based on the column-matching algorithm proposed before. The mixed-mode strategy divides the test sequence into two disjoint phases: first the pseudo random phase detects the easy-to-detect faults, and the subsequent deterministic phase generates test vectors needed to fully test the circuit. The lengths of these two phases directly influence both the test time and the BIST area overhead, as well as the BIST design time. Some kind of trade-off has to be found, to design the BIST circuitry efficiently. The pseudo-random testability of the ISCAS benchmarks is studied here. The conclusions obtained here can be generalized to be applied to any circuit. In this paper we present a discussion on choosing the test lengths in our mixed-mode BIST technique. The BIST design method is based on the column-matching algorithm proposed before. The mixed-mode strategy divides the test sequence into two disjoint phases: first the pseudo random phase detects the easy-to-detect faults, and the subsequent deterministic phase generates test vectors needed to fully test the circuit. The lengths of these two phases directly influence both the test time and the BIST area overhead, as well as the BIST design time. Some kind of trade-off has to be found, to design the BIST circuitry efficiently. The pseudo-random testability of the ISCAS benchmarks is studied here. The conclusions obtained here can be generalized to be applied to any circuit.
dcterms:title
Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST Není k dispozici
skos:prefLabel
Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST Není k dispozici Influence of the Test Lengths on Area Overhead in Mixed-Mode BIST
skos:notation
RIV/68407700:21230/04:03100099!RIV/2005/GA0/212305/N
n3:strany
201 ; 204
n3:aktivita
n4:Z n4:P
n3:aktivity
P(GA102/04/2137), Z(MSM 212300014)
n3:dodaniDat
n13:2005
n3:domaciTvurceVysledku
n22:7140827 n22:2194937
n3:druhVysledku
n9:D
n3:duvernostUdaju
n21:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
568059
n3:idVysledku
RIV/68407700:21230/04:03100099
n3:jazykVysledku
n15:eng
n3:klicovaSlova
digital testing, mixed-mode BIST, test length, area overhead
n3:klicoveSlovo
n8:area%20overhead n8:mixed-mode%20BIST n8:test%20length n8:digital%20testing
n3:kontrolniKodProRIV
[9EB4679DECA6]
n3:mistoKonaniAkce
Tallinn
n3:mistoVydani
Tallinn
n3:nazevZdroje
Proceedings of the 9th Biennial Baltic Electronics Conference
n3:obor
n16:JC
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n18:GA102%2F04%2F2137
n3:rokUplatneniVysledku
n13:2004
n3:tvurceVysledku
Fišer, Petr Kubátová, Hana
n3:typAkce
n7:WRD
n3:zahajeniAkce
2004-10-03+02:00
n3:zamer
n20:MSM%20212300014
s:numberOfPages
4
n5:hasPublisher
Tallinn Technical University
n10:isbn
9985-59-462-2
n11:organizacniJednotka
21230