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Statements

Subject Item
n2:RIV%2F68407700%3A21220%2F11%3A00189607%21RIV12-MSM-21220___
rdf:type
skos:Concept n16:Vysledek
dcterms:description
DLTS is one of several methods for detecting and characterizing deep levels in semiconductors. Its major strength is that it is spectroscopic, i.e. it gives a unique line or peak for each deep level detected, in a way which makes it quick and easy to relate the spectrum to the concentration and energy of each defect - at least in quantitative sense. Quantitative information is obtained from the spectra with a small amount of analysis and the signatures of common defects. DLTS is one of several methods for detecting and characterizing deep levels in semiconductors. Its major strength is that it is spectroscopic, i.e. it gives a unique line or peak for each deep level detected, in a way which makes it quick and easy to relate the spectrum to the concentration and energy of each defect - at least in quantitative sense. Quantitative information is obtained from the spectra with a small amount of analysis and the signatures of common defects.
dcterms:title
DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons
skos:prefLabel
DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons DLTS Measurement of Energetic Levels in Silicon Detector Damaged by Neutrons
skos:notation
RIV/68407700:21220/11:00189607!RIV12-MSM-21220___
n16:predkladatel
n20:orjk%3A21220
n4:aktivita
n15:Z
n4:aktivity
Z(MSM6840770029)
n4:dodaniDat
n12:2012
n4:domaciTvurceVysledku
n7:7735472 n7:8733384 n7:7781725 n7:5545706
n4:druhVysledku
n21:D
n4:duvernostUdaju
n10:S
n4:entitaPredkladatele
n13:predkladatel
n4:idSjednocenehoVysledku
195084
n4:idVysledku
RIV/68407700:21220/11:00189607
n4:jazykVysledku
n22:eng
n4:klicovaSlova
DLTS Measurement; Silicon Detector; Neutrons Damaged
n4:klicoveSlovo
n9:Neutrons%20Damaged n9:DLTS%20Measurement n9:Silicon%20Detector
n4:kontrolniKodProRIV
[53886F52A13C]
n4:mistoKonaniAkce
Nový Smokovec
n4:mistoVydani
Žilina
n4:nazevZdroje
Proceedings of the 17th International Conference on Applied Physics of Condensed Matter
n4:obor
n17:BG
n4:pocetDomacichTvurcuVysledku
4
n4:pocetTvurcuVysledku
6
n4:rokUplatneniVysledku
n12:2011
n4:tvurceVysledku
Chren, Dominik Dammer, Jiří Vlk, Josef Sopko, Vít Kohout, Zdeněk Sopko, Bruno
n4:typAkce
n14:WRD
n4:zahajeniAkce
2011-06-22+02:00
n4:zamer
n8:MSM6840770029
s:numberOfPages
4
n3:hasPublisher
Žilinská univerzita v Žiline
n11:isbn
978-80-554-0386-1
n19:organizacniJednotka
21220