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Statements

Subject Item
n2:RIV%2F68407700%3A21220%2F09%3A00157489%21RIV10-MSM-21220___
rdf:type
skos:Concept n18:Vysledek
dcterms:description
Thin layer resistance measurement using the change of complex coil impedance is a contact-less method for conductive layer diagnostics. Thin layer resistance measurement using the change of complex coil impedance is a contact-less method for conductive layer diagnostics.
dcterms:title
Contactless Diagnostics of Thin Film Layers Contactless Diagnostics of Thin Film Layers
skos:prefLabel
Contactless Diagnostics of Thin Film Layers Contactless Diagnostics of Thin Film Layers
skos:notation
RIV/68407700:21220/09:00157489!RIV10-MSM-21220___
n3:aktivita
n20:Z
n3:aktivity
Z(MSM6840770015)
n3:dodaniDat
n14:2010
n3:domaciTvurceVysledku
n15:3460835
n3:druhVysledku
n4:D
n3:duvernostUdaju
n7:S
n3:entitaPredkladatele
n11:predkladatel
n3:idSjednocenehoVysledku
308163
n3:idVysledku
RIV/68407700:21220/09:00157489
n3:jazykVysledku
n9:eng
n3:klicovaSlova
thin film diagnostics
n3:klicoveSlovo
n5:thin%20film%20diagnostics
n3:kontrolniKodProRIV
[F3BDBF550E5D]
n3:mistoKonaniAkce
Lisabon
n3:mistoVydani
Lisbon
n3:nazevZdroje
XIX IMEKO World Congress 2009 - Fundamental and Applied Metrology
n3:obor
n6:JA
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
2
n3:rokUplatneniVysledku
n14:2009
n3:tvurceVysledku
Papežová, Stanislava Papež, Václav
n3:typAkce
n21:WRD
n3:zahajeniAkce
2009-09-06+02:00
n3:zamer
n10:MSM6840770015
s:numberOfPages
6
n19:hasPublisher
Instituto Superior Técnico/Instituto de Telecomunicaçoes Portugal
n16:isbn
978-963-88410-0-1
n13:organizacniJednotka
21220