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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F14%3A00438610%21RIV15-AV0-68378271
rdf:type
skos:Concept n16:Vysledek
dcterms:description
Optical waveguiding properties of a thick wurtzite aluminum nitride highly [002]-textured hetero-epitaxial film on (001) basal plane of sapphire substrate are studied. The physical properties of the film are determined by X-ray diffraction, atomic force microscopy, microRaman, and photocurrent spectroscopy. The refractive index and the thermo-optic coefficients are determined by m-lines spectroscopy using the classical prism coupling technique. The optical losses of this planar waveguide are also measured in the spectral range of 450–1553 nm. The lower value of optical losses is equal to 0.7 dB/cm at 1553 nm. The optical losses due to the surface scattering are simulated showing that the contribution is the most significant at near infrared wavelength range, whereas the optical losses are due to volume scattering and material absorption in the visible range. Optical waveguiding properties of a thick wurtzite aluminum nitride highly [002]-textured hetero-epitaxial film on (001) basal plane of sapphire substrate are studied. The physical properties of the film are determined by X-ray diffraction, atomic force microscopy, microRaman, and photocurrent spectroscopy. The refractive index and the thermo-optic coefficients are determined by m-lines spectroscopy using the classical prism coupling technique. The optical losses of this planar waveguide are also measured in the spectral range of 450–1553 nm. The lower value of optical losses is equal to 0.7 dB/cm at 1553 nm. The optical losses due to the surface scattering are simulated showing that the contribution is the most significant at near infrared wavelength range, whereas the optical losses are due to volume scattering and material absorption in the visible range.
dcterms:title
Dispersion properties and low infrared optical losses in epitaxial AlN on sapphire substrate in the visible and infrared range Dispersion properties and low infrared optical losses in epitaxial AlN on sapphire substrate in the visible and infrared range
skos:prefLabel
Dispersion properties and low infrared optical losses in epitaxial AlN on sapphire substrate in the visible and infrared range Dispersion properties and low infrared optical losses in epitaxial AlN on sapphire substrate in the visible and infrared range
skos:notation
RIV/68378271:_____/14:00438610!RIV15-AV0-68378271
n3:aktivita
n11:I
n3:aktivity
I
n3:cisloPeriodika
16
n3:dodaniDat
n5:2015
n3:domaciTvurceVysledku
Mortet, Vincent
n3:druhVysledku
n9:J
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n13:predkladatel
n3:idSjednocenehoVysledku
11761
n3:idVysledku
RIV/68378271:_____/14:00438610
n3:jazykVysledku
n10:eng
n3:klicovaSlova
III-V semiconductors; AlN films; surface scattering; refractive index; optical properties
n3:klicoveSlovo
n7:III-V%20semiconductors n7:refractive%20index n7:AlN%20films n7:surface%20scattering n7:optical%20properties
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[28964E0BDA86]
n3:nazevZdroje
Journal of Applied Physics
n3:obor
n8:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
11
n3:rokUplatneniVysledku
n5:2014
n3:svazekPeriodika
115
n3:tvurceVysledku
Rousseau, M. Barkad, H. A. Soltani, A. Mortet, Vincent Mattalah, M. Stolz, A. Gerbedoen, J.-C. Bourzgui, N. De Jaeger, J.-C. BenMoussa, A. Charrier, J.
n3:wos
000335228400028
s:issn
0021-8979
s:numberOfPages
6
n14:doi
10.1063/1.4873236