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Namespace Prefixes

PrefixIRI
dctermshttp://purl.org/dc/terms/
n9http://linked.opendata.cz/resource/domain/vavai/projekt/
n5http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n16http://linked.opendata.cz/ontology/domain/vavai/
shttp://schema.org/
n4http://linked.opendata.cz/ontology/domain/vavai/riv/
skoshttp://www.w3.org/2004/02/skos/core#
n8http://bibframe.org/vocab/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n10http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F68378271%3A_____%2F14%3A00432629%21RIV15-GA0-68378271/
n6http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n15http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n11http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n14http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n13http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n17http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F14%3A00432629%21RIV15-GA0-68378271
rdf:type
n16:Vysledek skos:Concept
dcterms:description
We studied the processes of hole and electron trapping in yttrium orthosilicate Y2SiO5 single crystals using continuous wave and pulse electron spin resonance methods. We show that holes created by x-ray irradiation at low temperatures (T <80 K) are preferably self-trapped at Si-unbound oxygen ions in the form of O- centers. Under irradiation at higher temperatures (200–290 K), the holes are trapped at the Si-unbound oxygen ions in the vicinity of perturbing defects such as yttrium vacancies and impurity ions forming a variety of O- centers with thermal stability up to room and higher temperatures. We have also found that under x-ray irradiation at T < 60 K, electrons are preferably trapped in the vicinity of Si-unbound oxygen ion vacancies and partly trapped also at Mo impurity ions in the form of F+-type and Mo5+ centers, respectively. We studied the processes of hole and electron trapping in yttrium orthosilicate Y2SiO5 single crystals using continuous wave and pulse electron spin resonance methods. We show that holes created by x-ray irradiation at low temperatures (T <80 K) are preferably self-trapped at Si-unbound oxygen ions in the form of O- centers. Under irradiation at higher temperatures (200–290 K), the holes are trapped at the Si-unbound oxygen ions in the vicinity of perturbing defects such as yttrium vacancies and impurity ions forming a variety of O- centers with thermal stability up to room and higher temperatures. We have also found that under x-ray irradiation at T < 60 K, electrons are preferably trapped in the vicinity of Si-unbound oxygen ion vacancies and partly trapped also at Mo impurity ions in the form of F+-type and Mo5+ centers, respectively.
dcterms:title
Electron and hole traps in yttrium orthosilicate single crystals: the critical role of Si-unbound oxygen Electron and hole traps in yttrium orthosilicate single crystals: the critical role of Si-unbound oxygen
skos:prefLabel
Electron and hole traps in yttrium orthosilicate single crystals: the critical role of Si-unbound oxygen Electron and hole traps in yttrium orthosilicate single crystals: the critical role of Si-unbound oxygen
skos:notation
RIV/68378271:_____/14:00432629!RIV15-GA0-68378271
n4:aktivita
n15:I n15:P
n4:aktivity
I, P(GAP204/12/0805), P(LM2011029)
n4:cisloPeriodika
6
n4:dodaniDat
n17:2015
n4:domaciTvurceVysledku
n5:5093732 n5:4774981 n5:2125587 n5:7420250 n5:5988446 n5:1021508
n4:druhVysledku
n13:J
n4:duvernostUdaju
n18:S
n4:entitaPredkladatele
n10:predkladatel
n4:idSjednocenehoVysledku
14167
n4:idVysledku
RIV/68378271:_____/14:00432629
n4:jazykVysledku
n11:eng
n4:klicovaSlova
ESR; yttrium orthosilicates; ESEEM; charge traps; F+ centers
n4:klicoveSlovo
n6:yttrium%20orthosilicates n6:ESR n6:ESEEM n6:F%2B%20centers n6:charge%20traps
n4:kodStatuVydavatele
US - Spojené státy americké
n4:kontrolniKodProRIV
[3BD44A88238D]
n4:nazevZdroje
Physical Review. B
n4:obor
n14:BM
n4:pocetDomacichTvurcuVysledku
6
n4:pocetTvurcuVysledku
10
n4:projekt
n9:LM2011029 n9:GAP204%2F12%2F0805
n4:rokUplatneniVysledku
n17:2014
n4:svazekPeriodika
90
n4:tvurceVysledku
Kärner, T. Zazubovich, S. Nikl, Martin Rosa, Jan Hybler, Jiří Buryi, Maksym McClellan, K. J. Stanek, C. R. Laguta, Valentyn Savchenko, Dariia
n4:wos
000339994200003
s:issn
1098-0121
s:numberOfPages
12
n8:doi
10.1103/PhysRevB.90.064104