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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F14%3A00432054%21RIV15-GA0-68378271
rdf:type
skos:Concept n13:Vysledek
dcterms:description
In this work, a group of Lu2SiO5:Tb (LSO:Tb) scintillating layers with a Tb concentration between 8% and 19% were investigated by means of synchrotron and laboratory techniques. The scintillation efficiency measurements proved that the highest light yield is obtained for a Tb concentration equal to 15%. At higher concentration, quenching processes occur which lower the light emission. The analysis of the reciprocal space maps of the (082) (280) and (040) Bragg reflections showed that LSO:Tb epilayers are well adapted on YbSO substrates for all the investigated concentrations. The spatial resolution tests demonstrated the possibility to achieve a resolution of 1 μm with a 6 μm thick scintillating layer. In this work, a group of Lu2SiO5:Tb (LSO:Tb) scintillating layers with a Tb concentration between 8% and 19% were investigated by means of synchrotron and laboratory techniques. The scintillation efficiency measurements proved that the highest light yield is obtained for a Tb concentration equal to 15%. At higher concentration, quenching processes occur which lower the light emission. The analysis of the reciprocal space maps of the (082) (280) and (040) Bragg reflections showed that LSO:Tb epilayers are well adapted on YbSO substrates for all the investigated concentrations. The spatial resolution tests demonstrated the possibility to achieve a resolution of 1 μm with a 6 μm thick scintillating layer.
dcterms:title
Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications
skos:prefLabel
Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications
skos:notation
RIV/68378271:_____/14:00432054!RIV15-GA0-68378271
n3:aktivita
n14:P n14:I
n3:aktivity
I, P(GAP204/12/0805)
n3:cisloPeriodika
MAR
n3:dodaniDat
n9:2015
n3:domaciTvurceVysledku
n8:3941450 n8:1770187 n8:1021508
n3:druhVysledku
n15:J
n3:duvernostUdaju
n12:S
n3:entitaPredkladatele
n10:predkladatel
n3:idSjednocenehoVysledku
22769
n3:idVysledku
RIV/68378271:_____/14:00432054
n3:jazykVysledku
n18:eng
n3:klicovaSlova
LSO:Tb; X-ray imaging; indirect detector
n3:klicoveSlovo
n11:indirect%20detector n11:X-ray%20imaging n11:LSO%3ATb
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[79D7A37AB1B1]
n3:nazevZdroje
Radiation Measurements
n3:obor
n17:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
13
n3:projekt
n16:GAP204%2F12%2F0805
n3:rokUplatneniVysledku
n9:2014
n3:svazekPeriodika
62
n3:tvurceVysledku
Hamann, E. Douissard, P.-A. Rack, A. Fiederle, M. Krause, B. Cecilia, A. Jarý, Vítězslav Mihóková, Eva Nikl, Martin Hänschke, D. Grigorievc, D. Baumbach, T. Martin, T.
n3:wos
000334003200006
s:issn
1350-4487
s:numberOfPages
7
n4:doi
10.1016/j.radmeas.2013.12.005