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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F13%3A00424738%21RIV14-MSM-68378271
rdf:type
n9:Vysledek skos:Concept
dcterms:description
Thin film based solar cells are surprisingly complex devices, mainly due to their micro and nanostructure. The nanostructure may be due to naturally occurring heterogeneities, for example crystalline grains, grain boundaries, defects in microcrystalline silicon, CdTe or CIS layers). The nanostructure is often part of the solar cell design, for example in bulk heterojunction cells or dye sensitized cells. In novel types of the cells nanostructured electrodes or light trapping structures are often used to improve the photovoltaic conversion efficiency. Nanometer-scale characterization using the scanning probe methods can provide information not only about the structure, but also about the functionality such as dark and illuminated surface potential, dark and illuminated conductivity, dielectric constant etc. Here, the experiments based on atomic force microscopy with conductive cantilever used as local contact are reviewed for the case of mixed phase silicon thin films. Thin film based solar cells are surprisingly complex devices, mainly due to their micro and nanostructure. The nanostructure may be due to naturally occurring heterogeneities, for example crystalline grains, grain boundaries, defects in microcrystalline silicon, CdTe or CIS layers). The nanostructure is often part of the solar cell design, for example in bulk heterojunction cells or dye sensitized cells. In novel types of the cells nanostructured electrodes or light trapping structures are often used to improve the photovoltaic conversion efficiency. Nanometer-scale characterization using the scanning probe methods can provide information not only about the structure, but also about the functionality such as dark and illuminated surface potential, dark and illuminated conductivity, dielectric constant etc. Here, the experiments based on atomic force microscopy with conductive cantilever used as local contact are reviewed for the case of mixed phase silicon thin films.
dcterms:title
Nano-level characterization of silicon thin films and solar cells Nano-level characterization of silicon thin films and solar cells
skos:prefLabel
Nano-level characterization of silicon thin films and solar cells Nano-level characterization of silicon thin films and solar cells
skos:notation
RIV/68378271:_____/13:00424738!RIV14-MSM-68378271
n9:predkladatel
n19:ico%3A68378271
n3:aktivita
n11:P n11:I
n3:aktivity
I, P(LM2011026)
n3:dodaniDat
n14:2014
n3:domaciTvurceVysledku
n17:3750299
n3:druhVysledku
n6:C
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n10:predkladatel
n3:idSjednocenehoVysledku
90604
n3:idVysledku
RIV/68378271:_____/13:00424738
n3:jazykVysledku
n5:eng
n3:klicovaSlova
silicon; thin films; atomic force microscopy; photoresponse
n3:klicoveSlovo
n4:atomic%20force%20microscopy n4:silicon n4:thin%20films n4:photoresponse
n3:kontrolniKodProRIV
[DBCC9A8D07A7]
n3:mistoVydani
Tokyo
n3:nazevZdroje
Solar Cell Technology Handbook
n3:obor
n16:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetStranKnihy
1018
n3:pocetTvurcuVysledku
1
n3:projekt
n18:LM2011026
n3:rokUplatneniVysledku
n14:2013
n3:tvurceVysledku
Fejfar, Antonín
s:numberOfPages
11
n8:hasPublisher
Ohmsha
n13:isbn
978-4-274-21399-1