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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F13%3A00396259%21RIV14-GA0-68378271
rdf:type
skos:Concept n15:Vysledek
dcterms:description
Textures, stresses, and strains, as well as the overall so-called real structure, are crucial for properties of thin films deposited by different methods and can have both positive and negative effects depending on the film and its application. They were studied by a combination of different X-ray diffraction (XRD) techniques for several ZnO films. The films prepared by pulsed laser deposition (PLD) on MgO and sapphire single-crystalline substrates and amorphous-fused silica showed different kinds of strong preferred orientation and also different stresses that could be estimated only from the analysis of quite narrow, nonzero intensity regions of diffraction spots. XRD line broadening was analyzed by a combination of different asymmetric scans. Fiber (0001) texture and tensile residual stresses were found on fused silica, while domains with local epitaxy and huge compressive ... Textures, stresses, and strains, as well as the overall so-called real structure, are crucial for properties of thin films deposited by different methods and can have both positive and negative effects depending on the film and its application. They were studied by a combination of different X-ray diffraction (XRD) techniques for several ZnO films. The films prepared by pulsed laser deposition (PLD) on MgO and sapphire single-crystalline substrates and amorphous-fused silica showed different kinds of strong preferred orientation and also different stresses that could be estimated only from the analysis of quite narrow, nonzero intensity regions of diffraction spots. XRD line broadening was analyzed by a combination of different asymmetric scans. Fiber (0001) texture and tensile residual stresses were found on fused silica, while domains with local epitaxy and huge compressive ...
dcterms:title
On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation
skos:prefLabel
On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation On X-ray diffraction study of microstructure of ZnO thin nanocrystalline films with strong preferred grain orientation
skos:notation
RIV/68378271:_____/13:00396259!RIV14-GA0-68378271
n15:predkladatel
n16:ico%3A68378271
n4:aktivita
n18:P n18:I
n4:aktivity
I, P(GAP108/11/0958), P(GAP108/11/1539)
n4:cisloPeriodika
1
n4:dodaniDat
n13:2014
n4:domaciTvurceVysledku
n14:7772629
n4:druhVysledku
n19:J
n4:duvernostUdaju
n9:S
n4:entitaPredkladatele
n7:predkladatel
n4:idSjednocenehoVysledku
94001
n4:idVysledku
RIV/68378271:_____/13:00396259
n4:jazykVysledku
n6:eng
n4:klicovaSlova
zinc oxide thin film; X-ray diffraction; Mg0; fused silica
n4:klicoveSlovo
n5:fused%20silica n5:X-ray%20diffraction n5:zinc%20oxide%20thin%20film n5:Mg0
n4:kodStatuVydavatele
US - Spojené státy americké
n4:kontrolniKodProRIV
[C2F4C65ECE12]
n4:nazevZdroje
Metallurgical and Materials Transactions A
n4:obor
n11:BM
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
3
n4:projekt
n8:GAP108%2F11%2F1539 n8:GAP108%2F11%2F0958
n4:rokUplatneniVysledku
n13:2013
n4:svazekPeriodika
44A
n4:tvurceVysledku
Novotný, Michal Čížek, J. Kužel, R.
n4:wos
000313718500009
s:issn
1073-5623
s:numberOfPages
13
n10:doi
10.1007/s11661-012-1432-x