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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F13%3A00394390%21RIV14-GA0-68378271
rdf:type
n9:Vysledek skos:Concept
dcterms:description
The objective of this work was to develop an accurate method for automatic determination of the size of elliptical nanoparticles from atomic force microscopy (AFM) images that would yield results consistent with results of manual measurements by experts. The proposed method was applied on phenylpyridyldiketopyrrolopyrrole (PPDP). A PPDP layer consists of similarly sized elliptical particles (c. 100 nm 9 50 nm) and its properties can be estimated from the average length and width of the particles. The developed method is based on segmentation of salient particles by the watershed transform and approximation of their shapes by ellipses computed by image moments; it estimates the lengths and widths of the particles by the major and minor axes, respectively, of the corresponding ellipses. Its results proved to be consistent with results of manual measurements by a trained expert. The comparison showed that the developed method could be used in practice for precise automatic measurement of PPDP particles in AFM images. The objective of this work was to develop an accurate method for automatic determination of the size of elliptical nanoparticles from atomic force microscopy (AFM) images that would yield results consistent with results of manual measurements by experts. The proposed method was applied on phenylpyridyldiketopyrrolopyrrole (PPDP). A PPDP layer consists of similarly sized elliptical particles (c. 100 nm 9 50 nm) and its properties can be estimated from the average length and width of the particles. The developed method is based on segmentation of salient particles by the watershed transform and approximation of their shapes by ellipses computed by image moments; it estimates the lengths and widths of the particles by the major and minor axes, respectively, of the corresponding ellipses. Its results proved to be consistent with results of manual measurements by a trained expert. The comparison showed that the developed method could be used in practice for precise automatic measurement of PPDP particles in AFM images.
dcterms:title
Automatic Determination of the Size of Elliptical Nanoparticles from AFM Images Automatic Determination of the Size of Elliptical Nanoparticles from AFM Images
skos:prefLabel
Automatic Determination of the Size of Elliptical Nanoparticles from AFM Images Automatic Determination of the Size of Elliptical Nanoparticles from AFM Images
skos:notation
RIV/68378271:_____/13:00394390!RIV14-GA0-68378271
n9:predkladatel
n15:ico%3A68378271
n4:aktivita
n10:P n10:I
n4:aktivity
I, P(GAP103/11/1552), P(GAP304/10/1951), P(TA01011165)
n4:cisloPeriodika
8
n4:dodaniDat
n14:2014
n4:domaciTvurceVysledku
n7:4909054 n7:3131718
n4:druhVysledku
n19:J
n4:duvernostUdaju
n13:S
n4:entitaPredkladatele
n12:predkladatel
n4:idSjednocenehoVysledku
62603
n4:idVysledku
RIV/68378271:_____/13:00394390
n4:jazykVysledku
n17:eng
n4:klicovaSlova
Atomic force microscopy; Image moments; Pyrrole derivatives; Size determination; Watershed segmentation
n4:klicoveSlovo
n5:Atomic%20force%20microscopy n5:Image%20moments n5:Size%20determination n5:Pyrrole%20derivatives n5:Watershed%20segmentation
n4:kodStatuVydavatele
DE - Spolková republika Německo
n4:kontrolniKodProRIV
[F7D41713715D]
n4:nazevZdroje
Journal of Nanoparticle Research
n4:obor
n16:BM
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
6
n4:projekt
n6:GAP103%2F11%2F1552 n6:GAP304%2F10%2F1951 n6:TA01011165
n4:rokUplatneniVysledku
n14:2013
n4:svazekPeriodika
15
n4:tvurceVysledku
Zitová, Barbara Kratochvílová, Irena Sedlář, Jiří Kopeček, Jaromír Todorcius, T. Flusser, Jan
n4:wos
000322593200037
s:issn
1388-0764
s:numberOfPages
10
n18:doi
10.1007/s11051-013-1842-8