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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F12%3A00390150%21RIV13-AV0-68378271
rdf:type
skos:Concept n13:Vysledek
dcterms:description
Atomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are a direct result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related to the AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy. Atomic force microscopy (AFM) is a frequently used method applicable also to biological studies due to its capability of measuring in native environment. However, AFM images often contain features which are not present on the sample in reality, but are a direct result of the measurements itself. Such structures or features are denoted as artifacts. The artifacts arise from various reasons. Some of them can be avoided during measurements, other ones are inherent. The artifacts shown in this chapter are divided into several categories based on the part of AFM which is responsible for them. Examples of many artifacts are presented and their reasons are explained. This chapter will be helpful for AFM users who observe strange effects, presumably related to the AFM technique, but do not know their reason. This chapter can also answer questions about the validity of imaged features as well as their accuracy.
dcterms:title
Artifacts in atomic force microscopy of biological samples Artifacts in atomic force microscopy of biological samples
skos:prefLabel
Artifacts in atomic force microscopy of biological samples Artifacts in atomic force microscopy of biological samples
skos:notation
RIV/68378271:_____/12:00390150!RIV13-AV0-68378271
n13:predkladatel
n22:ico%3A68378271
n4:aktivita
n16:P n16:Z
n4:aktivity
P(KAN400100701), P(LC06040), P(LC510), Z(AV0Z10100521)
n4:dodaniDat
n5:2013
n4:domaciTvurceVysledku
Kozak, Halyna Ukraintsev, Egor n20:9994602 n20:7465416 n20:7166494
n4:druhVysledku
n6:C
n4:duvernostUdaju
n21:S
n4:entitaPredkladatele
n15:predkladatel
n4:idSjednocenehoVysledku
123704
n4:idVysledku
RIV/68378271:_____/12:00390150
n4:jazykVysledku
n7:eng
n4:klicovaSlova
atomic force microscopy (AFM); validity of measurement; accuracy of measurement
n4:klicoveSlovo
n18:validity%20of%20measurement n18:accuracy%20of%20measurement n18:atomic%20force%20microscopy%20%28AFM%29
n4:kontrolniKodProRIV
[8F21FB8BF4DD]
n4:mistoVydani
Rijeka
n4:nazevZdroje
Atomic Force Microscopy Investigations into Biology - From Cell to Protein
n4:obor
n11:BM
n4:pocetDomacichTvurcuVysledku
5
n4:pocetStranKnihy
354
n4:pocetTvurcuVysledku
5
n4:projekt
n12:KAN400100701 n12:LC510 n12:LC06040
n4:rokUplatneniVysledku
n5:2012
n4:tvurceVysledku
Kozak, Halyna Rezek, Bohuslav Ukraintsev, Egor Kromka, Alexander Remeš, Zdeněk
n4:zamer
n17:AV0Z10100521
s:numberOfPages
26
n14:doi
10.5772/2092
n10:hasPublisher
InTech
n8:isbn
978-953-51-0114-7