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Namespace Prefixes

PrefixIRI
dctermshttp://purl.org/dc/terms/
n9http://linked.opendata.cz/resource/domain/vavai/projekt/
n7http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n13http://linked.opendata.cz/resource/domain/vavai/subjekt/
n12http://linked.opendata.cz/ontology/domain/vavai/
n17http://linked.opendata.cz/resource/domain/vavai/zamer/
shttp://schema.org/
n4http://linked.opendata.cz/ontology/domain/vavai/riv/
skoshttp://www.w3.org/2004/02/skos/core#
n18http://bibframe.org/vocab/
n8http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F68378271%3A_____%2F12%3A00378662%21RIV13-GA0-68378271/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n15http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n20http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n11http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n5http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n19http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n6http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F12%3A00378662%21RIV13-GA0-68378271
rdf:type
skos:Concept n12:Vysledek
dcterms:description
ZnO thin films were grown by pulsed laser deposition on three different substrates: sapphire (0 0 0 1), MgO (1 0 0) and fused silica (FS). The structure and morphology of the films were characterized by x-ray diffraction and scanning electron microscopy and defect studies were carried out using slow positron implantation spectroscopy (SPIS). Films deposited on all substrates studied in this work exhibit the wurtzite ZnO structure and are characterized by an average crystallite size of 20-100 nm. However, strong differences in the microstructure of films deposited on various substrates were found. The ZnO films deposited on MgO and sapphire single-crystalline substrates exhibit local epitaxy, i.e. a well-defined relation between film crystallites and the substrate. Domains with different orientation relationships with the substrate were found in both films. On the other hand, the film deposited on the FS substrate exhibits fibre texture with random lateral orientation ... ZnO thin films were grown by pulsed laser deposition on three different substrates: sapphire (0 0 0 1), MgO (1 0 0) and fused silica (FS). The structure and morphology of the films were characterized by x-ray diffraction and scanning electron microscopy and defect studies were carried out using slow positron implantation spectroscopy (SPIS). Films deposited on all substrates studied in this work exhibit the wurtzite ZnO structure and are characterized by an average crystallite size of 20-100 nm. However, strong differences in the microstructure of films deposited on various substrates were found. The ZnO films deposited on MgO and sapphire single-crystalline substrates exhibit local epitaxy, i.e. a well-defined relation between film crystallites and the substrate. Domains with different orientation relationships with the substrate were found in both films. On the other hand, the film deposited on the FS substrate exhibits fibre texture with random lateral orientation ...
dcterms:title
Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition
skos:prefLabel
Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition
skos:notation
RIV/68378271:_____/12:00378662!RIV13-GA0-68378271
n12:predkladatel
n13:ico%3A68378271
n4:aktivita
n5:Z n5:P
n4:aktivity
P(GAP108/11/0958), P(GAP108/11/1539), P(GP202/09/P324), Z(AV0Z10100522)
n4:cisloPeriodika
22
n4:dodaniDat
n6:2013
n4:domaciTvurceVysledku
n7:7433514 n7:7772629 n7:9640495
n4:druhVysledku
n16:J
n4:duvernostUdaju
n20:S
n4:entitaPredkladatele
n8:predkladatel
n4:idSjednocenehoVysledku
171813
n4:idVysledku
RIV/68378271:_____/12:00378662
n4:jazykVysledku
n11:eng
n4:klicovaSlova
ZnO thin film; pulsed laser deposition; x-ray diffraction positron implantation spectroscopy
n4:klicoveSlovo
n15:ZnO%20thin%20film n15:pulsed%20laser%20deposition n15:x-ray%20diffraction%20positron%20implantation%20spectroscopy
n4:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n4:kontrolniKodProRIV
[BF9482901534]
n4:nazevZdroje
Journal of Physics D-Applied Physics
n4:obor
n19:BM
n4:pocetDomacichTvurcuVysledku
3
n4:pocetTvurcuVysledku
11
n4:projekt
n9:GAP108%2F11%2F1539 n9:GAP108%2F11%2F0958 n9:GP202%2F09%2FP324
n4:rokUplatneniVysledku
n6:2012
n4:svazekPeriodika
45
n4:tvurceVysledku
Connolly, J. Novotný, Michal Lančok, Ján Anwand, W. Kužel, R. Krishnamurthy, S. Mosnier, J.-P. McCarthy, E. Bulíř, Jiří Čížek, J. Brauer, G.
n4:wos
000305175100003
n4:zamer
n17:AV0Z10100522
s:issn
0022-3727
s:numberOfPages
12
n18:doi
10.1088/0022-3727/45/22/225101