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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F11%3A00368068%21RIV12-AV0-68378271
rdf:type
n15:Vysledek skos:Concept
dcterms:description
Thin dielectric resonator consisting only of the low-loss dielectric substrate and deposited film is proposed for the electrode-free microwave characterization of thin films and substrates. In-plane microwave dielectric parameters of a number of substrates and thin films were measured in a broad temperature range using the TE01δ resonance mode. Dielectric anomalies corresponding to the induced phase transitions were observed. The HE11δ mode is proposed for the in-plane dielectric anisotropy characterization. The anisotropy of the (110) DyScO3 substrate was measured. Thin dielectric resonator consisting only of the low-loss dielectric substrate and deposited film is proposed for the electrode-free microwave characterization of thin films and substrates. In-plane microwave dielectric parameters of a number of substrates and thin films were measured in a broad temperature range using the TE01δ resonance mode. Dielectric anomalies corresponding to the induced phase transitions were observed. The HE11δ mode is proposed for the in-plane dielectric anisotropy characterization. The anisotropy of the (110) DyScO3 substrate was measured.
dcterms:title
Thin dielectric resonators for microwave characterization of films and substrates Thin dielectric resonators for microwave characterization of films and substrates
skos:prefLabel
Thin dielectric resonators for microwave characterization of films and substrates Thin dielectric resonators for microwave characterization of films and substrates
skos:notation
RIV/68378271:_____/11:00368068!RIV12-AV0-68378271
n15:predkladatel
n19:ico%3A68378271
n5:aktivita
n8:Z
n5:aktivity
Z(AV0Z10100520)
n5:dodaniDat
n11:2012
n5:domaciTvurceVysledku
Bovtun, Viktor n17:3390888 n17:7348320
n5:druhVysledku
n20:D
n5:duvernostUdaju
n12:S
n5:entitaPredkladatele
n7:predkladatel
n5:idSjednocenehoVysledku
235252
n5:idVysledku
RIV/68378271:_____/11:00368068
n5:jazykVysledku
n18:eng
n5:klicovaSlova
microwave dielectric properties; thin film; dielectric resonator
n5:klicoveSlovo
n14:thin%20film n14:dielectric%20resonator n14:microwave%20dielectric%20properties
n5:kontrolniKodProRIV
[34E5264C3DCF]
n5:mistoKonaniAkce
Sevastopol
n5:mistoVydani
Sevastopol
n5:nazevZdroje
Microwave and Telecommunication Technology (CriMiCo) 2011. 21th International Crimean Conference
n5:obor
n16:BM
n5:pocetDomacichTvurcuVysledku
3
n5:pocetTvurcuVysledku
7
n5:rokUplatneniVysledku
n11:2011
n5:tvurceVysledku
Yakymenko, Y. Bovtun, Viktor Kamba, Stanislav Molchanov, V. Kempa, Martin Pashkov, V. Poplavko, Y.
n5:typAkce
n10:WRD
n5:zahajeniAkce
2011-09-12+02:00
n5:zamer
n9:AV0Z10100520
s:numberOfPages
2
n21:hasPublisher
Veber
n13:isbn
978-966-335-351-7