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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F11%3A00361461%21RIV12-AV0-68378271
rdf:type
n11:Vysledek skos:Concept
dcterms:description
In this work we focus on well known interband transitions for the perovskite materials, 2p-->dγ, located in VUV spectral region. Dielectric functions of chemical solution deposited and sputtered PZT were obtained in the spectral range 1-8.8 eV. Differences between the absorption maxima for chemical solution deposited and sputtered PbZrxTi1-xO3 samples near Kahn-Leyendecker 2p-->dγ interband transition were found and are interpreted by change of interatomic distances. In this work we focus on well known interband transitions for the perovskite materials, 2p-->dγ, located in VUV spectral region. Dielectric functions of chemical solution deposited and sputtered PZT were obtained in the spectral range 1-8.8 eV. Differences between the absorption maxima for chemical solution deposited and sputtered PbZrxTi1-xO3 samples near Kahn-Leyendecker 2p-->dγ interband transition were found and are interpreted by change of interatomic distances.
dcterms:title
Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films
skos:prefLabel
Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O3 films
skos:notation
RIV/68378271:_____/11:00361461!RIV12-AV0-68378271
n11:predkladatel
n18:ico%3A68378271
n3:aktivita
n12:Z n12:I n12:P
n3:aktivity
I, P(1M06002), P(GA202/08/1009), P(GC202/09/J017), P(KAN301370701), Z(AV0Z10100522)
n3:cisloPeriodika
9
n3:dodaniDat
n8:2012
n3:domaciTvurceVysledku
n10:7160534 n10:5193222 Dejneka, Alexandr n10:6208991 n10:4782194
n3:druhVysledku
n17:J
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n5:predkladatel
n3:idSjednocenehoVysledku
237799
n3:idVysledku
RIV/68378271:_____/11:00361461
n3:jazykVysledku
n20:eng
n3:klicovaSlova
PZT film; vacuum-ultraviolet ellipsometry; film structure; optical properties
n3:klicoveSlovo
n6:film%20structure n6:vacuum-ultraviolet%20ellipsometry n6:optical%20properties n6:PZT%20film
n3:kodStatuVydavatele
CH - Švýcarská konfederace
n3:kontrolniKodProRIV
[42EABD1034A7]
n3:nazevZdroje
Thin Solid Films
n3:obor
n4:BH
n3:pocetDomacichTvurcuVysledku
5
n3:pocetTvurcuVysledku
8
n3:projekt
n13:GA202%2F08%2F1009 n13:KAN301370701 n13:1M06002 n13:GC202%2F09%2FJ017
n3:rokUplatneniVysledku
n8:2011
n3:svazekPeriodika
519
n3:tvurceVysledku
Jastrabík, Lubomír Dejneka, Alexandr Chvostová, Dagmar Kousal, J. Gerlach, G. Lynnyková, Anna Železný, Vladimír Suchaneck, G.
n3:wos
000289174200070
n3:zamer
n19:AV0Z10100522
s:issn
0040-6090
s:numberOfPages
4
n14:doi
10.1016/j.tsf.2010.11.076