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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F10%3A00349618%21RIV11-AV0-68378271
rdf:type
n9:Vysledek skos:Concept
dcterms:description
Monoclinic and tetragonal zirconia samples were characterized by X-ray diffraction, pycnometry, thermogravimetric analysis (TGA), Fourier transform (FT) IR and mass (MS) spectroscopies, and scanning and transmission electron (TEM) microscopies. The results show, for the particular case of a tetragonal zirconia sample, an X-ray-undetected subproduct identified as an amorphous organic phase by FTIR–ATR (attenuated total reflection) and TGA–MS. The observations by TEM allowed this amorphous phase to be localized on the surface as a shell coating the nanoparticles. Moreover, this amorphous phase was quantified by Rietveld refinement via the addition of an internal silicon standard. Monoclinic and tetragonal zirconia samples were characterized by X-ray diffraction, pycnometry, thermogravimetric analysis (TGA), Fourier transform (FT) IR and mass (MS) spectroscopies, and scanning and transmission electron (TEM) microscopies. The results show, for the particular case of a tetragonal zirconia sample, an X-ray-undetected subproduct identified as an amorphous organic phase by FTIR–ATR (attenuated total reflection) and TGA–MS. The observations by TEM allowed this amorphous phase to be localized on the surface as a shell coating the nanoparticles. Moreover, this amorphous phase was quantified by Rietveld refinement via the addition of an internal silicon standard.
dcterms:title
Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles
skos:prefLabel
Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles Minimization of absorption contrast for accurate amorphous phase quantification: application to ZrO2 nanoparticles
skos:notation
RIV/68378271:_____/10:00349618!RIV11-AV0-68378271
n3:aktivita
n14:Z
n3:aktivity
Z(AV0Z10100521)
n3:cisloPeriodika
Part 5
n3:dodaniDat
n4:2011
n3:domaciTvurceVysledku
n16:6297102
n3:druhVysledku
n17:J
n3:duvernostUdaju
n12:S
n3:entitaPredkladatele
n15:predkladatel
n3:idSjednocenehoVysledku
271517
n3:idVysledku
RIV/68378271:_____/10:00349618
n3:jazykVysledku
n6:eng
n3:klicovaSlova
x-ray diffraction; Rietveld refinement; nanoparticles
n3:klicoveSlovo
n13:x-ray%20diffraction n13:nanoparticles n13:Rietveld%20refinement
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[067A135DD81F]
n3:nazevZdroje
Journal of Applied Crystallography
n3:obor
n11:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
6
n3:rokUplatneniVysledku
n4:2010
n3:svazekPeriodika
43
n3:tvurceVysledku
Jobic, S. Suzuki-Muresan, T. Petříček, Václav Grambow, B. Gautron, E. Deniard, P.
n3:wos
000281996600021
n3:zamer
n8:AV0Z10100521
s:issn
0021-8898
s:numberOfPages
8