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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F09%3A00334118%21RIV10-MSM-68378271
rdf:type
n5:Vysledek skos:Concept
dcterms:description
The article presents preliminary investigation results on the near-surface damage produced by single pulses of XUV free-electron laser in the amorphous alpha-SiO2, the monocrystalline silicon and the epitaxial films of gold. The article presents preliminary investigation results on the near-surface damage produced by single pulses of XUV free-electron laser in the amorphous alpha-SiO2, the monocrystalline silicon and the epitaxial films of gold.
dcterms:title
Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using X-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using X-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy
skos:prefLabel
Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using X-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy Damage in solids irradiated by a single shot of XUV free-electron laser: irreversible changes investigated using X-ray microdiffraction, atomic force microscopy and Nomarski optical microscopy
skos:notation
RIV/68378271:_____/09:00334118!RIV10-MSM-68378271
n3:aktivita
n13:Z n13:P
n3:aktivity
P(IAA400100701), P(KAN300100702), P(LA08024), P(LC510), P(LC528), Z(AV0Z10100523)
n3:cisloPeriodika
Suppl. 10
n3:dodaniDat
n18:2010
n3:domaciTvurceVysledku
n8:3493725 n8:2712679 n8:8434050 n8:6173047 n8:3274713
n3:druhVysledku
n15:J
n3:duvernostUdaju
n14:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
308996
n3:idVysledku
RIV/68378271:_____/09:00334118
n3:jazykVysledku
n11:eng
n3:klicovaSlova
XUV FEL; radiation damage; ablation; structure modifications; x-ray diffraction
n3:klicoveSlovo
n4:ablation n4:structure%20modifications n4:x-ray%20diffraction n4:radiation%20damage n4:XUV%20FEL
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[A42A489E652D]
n3:nazevZdroje
Radiation Physics and Chemistry
n3:obor
n16:BH
n3:pocetDomacichTvurcuVysledku
5
n3:pocetTvurcuVysledku
28
n3:projekt
n6:LC528 n6:LA08024 n6:IAA400100701 n6:LC510 n6:KAN300100702
n3:rokUplatneniVysledku
n18:2009
n3:svazekPeriodika
78
n3:tvurceVysledku
Burian, T. London, R. Davies, R. Krzywinski, J. Juha, Libor Burghammer, M. Hau-Riege, S. Stojanovic, N. Hájková, Věra Cihelka, Jaroslav Sokolowski-Tinten, K. Riekel, C. Zymierska, D. Nietubyc, R. Wawro, A. Petroutchik, A. Paszkowicz, W. Chalupský, Jaromír Toleikis, S. Pelka, J. B. Dynowska, E. Vyšín, Luděk Klinger, D. Jurek, M. Caliebe, W. Zastrau, U. Sobierajski, R. Szuszkiewicz, W.
n3:wos
000270692000011
n3:zamer
n7:AV0Z10100523
s:issn
0969-806X
s:numberOfPages
7