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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F08%3A00341951%21RIV10-MZP-68378271
rdf:type
n17:Vysledek skos:Concept
dcterms:description
Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques. Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques.
dcterms:title
C-AFM and X-TEM: studies of mixed-phase silicon thin films C-AFM and X-TEM: studies of mixed-phase silicon thin films
skos:prefLabel
C-AFM and X-TEM: studies of mixed-phase silicon thin films C-AFM and X-TEM: studies of mixed-phase silicon thin films
skos:notation
RIV/68378271:_____/08:00341951!RIV10-MZP-68378271
n3:aktivita
n15:P n15:Z
n3:aktivity
P(GD202/05/H003), P(IAA1010316), P(IAA1010413), P(LC06040), P(LC510), P(SN/3/172/05), Z(AV0Z10100521)
n3:cisloPeriodika
1
n3:dodaniDat
n9:2010
n3:domaciTvurceVysledku
n8:8470847 n8:6810756 n8:3750299 n8:9994602
n3:druhVysledku
n14:J
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
358712
n3:idVysledku
RIV/68378271:_____/08:00341951
n3:jazykVysledku
n12:eng
n3:klicovaSlova
conductive atomic force microscopy; cross-sectional transmission electron microscopy; silicon thin films
n3:klicoveSlovo
n4:cross-sectional%20transmission%20electron%20microscopy n4:silicon%20thin%20films n4:conductive%20atomic%20force%20microscopy
n3:kodStatuVydavatele
DE - Spolková republika Německo
n3:kontrolniKodProRIV
[642B68B9CD78]
n3:nazevZdroje
G.I.T. Imaging and Microscopy
n3:obor
n13:BM
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
7
n3:projekt
n11:LC06040 n11:IAA1010413 n11:SN%2F3%2F172%2F05 n11:LC510 n11:GD202%2F05%2FH003 n11:IAA1010316
n3:rokUplatneniVysledku
n9:2008
n3:svazekPeriodika
10
n3:tvurceVysledku
Rezek, Bohuslav Fejfar, Antonín Mates, Tomáš Kočka, Jan Schropp, R. E. I. Bronsveld, P. C. P. Rath, J. K.
n3:zamer
n10:AV0Z10100521
s:issn
1439-4243
s:numberOfPages
32