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Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F03%3A02030154%21RIV%2F2004%2FAV0%2FA02004%2FN
rdf:type
skos:Concept n21:Vysledek
dcterms:description
The paper recalls and reviews the fundamentals of variable ship length method, its week points and application limits. Possible drawbacks when measuring low gain values are stressed. The paper recalls and reviews the fundamentals of variable ship length method, its week points and application limits. Possible drawbacks when measuring low gain values are stressed.
dcterms:title
Optical gain measurements with variable stripe length wechnique. Optical gain measurements with variable stripe length wechnique.
skos:prefLabel
Optical gain measurements with variable stripe length wechnique. Optical gain measurements with variable stripe length wechnique.
skos:notation
RIV/68378271:_____/03:02030154!RIV/2004/AV0/A02004/N
n4:strany
223;242
n4:aktivita
n16:P n16:Z
n4:aktivity
P(GP202/01/D030), P(IAA1010809), Z(AV0Z1010914)
n4:dodaniDat
n5:2004
n4:domaciTvurceVysledku
n15:2874717 n15:9441034
n4:druhVysledku
n9:D
n4:duvernostUdaju
n18:S
n4:entitaPredkladatele
n11:predkladatel
n4:idSjednocenehoVysledku
619668
n4:idVysledku
RIV/68378271:_____/03:02030154
n4:jazykVysledku
n10:eng
n4:klicovaSlova
optical gain; semiconducting material; amplified spontanous emission; variable stripe length (VSL) method
n4:klicoveSlovo
n6:optical%20gain n6:variable%20stripe%20length%20%28VSL%29%20method n6:amplified%20spontanous%20emission n6:semiconducting%20material
n4:kontrolniKodProRIV
[B9E5320392C4]
n4:mistoKonaniAkce
Trento [IT]
n4:mistoVydani
Amsterdam
n4:nazevZdroje
Towards the First Silicon Laser.
n4:obor
n12:BM
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
6
n4:pocetUcastnikuAkce
0
n4:pocetZahranicnichUcastnikuAkce
0
n4:projekt
n14:GP202%2F01%2FD030 n14:IAA1010809
n4:rokUplatneniVysledku
n5:2003
n4:tvurceVysledku
Dohnalová, K. Hönerlage, B. Pelant, Ivan Valenta, J. Luterová, Kateřina Tomasiunas, R.
n4:typAkce
n8:WRD
n4:zahajeniAkce
2002-09-21+02:00
n4:zamer
n19:AV0Z1010914
s:numberOfPages
19
n20:hasPublisher
Kluwer Academic Publishers
n7:isbn
1-4020-1194-6