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Namespace Prefixes

PrefixIRI
dctermshttp://purl.org/dc/terms/
n14http://linked.opendata.cz/resource/domain/vavai/projekt/
n4http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n6http://linked.opendata.cz/ontology/domain/vavai/
n5http://linked.opendata.cz/resource/domain/vavai/zamer/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n12http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n15http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n11http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n10http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n8http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n17http://reference.data.gov.uk/id/gregorian-year/
n13http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F68378271%3A_____%2F01%3A02020047%21RIV%2F2003%2FAV0%2FA02003%2FN/

Statements

Subject Item
n2:RIV%2F68378271%3A_____%2F01%3A02020047%21RIV%2F2003%2FAV0%2FA02003%2FN
rdf:type
n6:Vysledek skos:Concept
dcterms:description
Analytical calculations of polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The thickness dependence of the optical refraction index was found to be proportional to squared polarization. Analytical calculations of polarization and optical refraction index in ferroelectric thin films are performed in the framework of thermodynamic theory. The thickness dependence of the optical refraction index was found to be proportional to squared polarization.
dcterms:title
Optical refraction index and polarization profile of ferroelectric thin films. Optical refraction index and polarization profile of ferroelectric thin films.
skos:prefLabel
Optical refraction index and polarization profile of ferroelectric thin films. Optical refraction index and polarization profile of ferroelectric thin films.
skos:notation
RIV/68378271:_____/01:02020047!RIV/2003/AV0/A02003/N
n3:strany
101;110
n3:aktivita
n15:P n15:Z
n3:aktivity
P(GA202/00/1425), P(LN00A015), Z(AV0Z1010914)
n3:cisloPeriodika
1-4
n3:dodaniDat
n17:2003
n3:domaciTvurceVysledku
n4:5193222 n4:5285003 Deineka, Alexander
n3:druhVysledku
n10:J
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n13:predkladatel
n3:idSjednocenehoVysledku
690205
n3:idVysledku
RIV/68378271:_____/01:02020047
n3:jazykVysledku
n11:eng
n3:klicovaSlova
thin film; - refraction index; - polarization; film thickness
n3:klicoveSlovo
n12:film%20thickness n12:-%20polarization n12:-%20refraction%20index n12:thin%20film
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[8BFCC57F63CB]
n3:nazevZdroje
Integrated Ferroelectrics
n3:obor
n8:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
8
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n14:LN00A015 n14:GA202%2F00%2F1425
n3:rokUplatneniVysledku
n17:2001
n3:svazekPeriodika
38
n3:tvurceVysledku
Jastrabík, Lubomír Sandner, T. Hrabovský, Miroslav Suchaneck, G. Gerlach, G. Glinchuk, M. D. Deineka, Alexander Eliseev, E. A.
n3:zamer
n5:AV0Z1010914
s:issn
1058-4587
s:numberOfPages
10