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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F14%3A00434111%21RIV15-TA0-68081731
rdf:type
skos:Concept n11:Vysledek
dcterms:description
Knowledge of the distribution and morphology of the Mg2Si precipitates (i.e. .beta.-phase) in Al-Mg-Si alloys are very important for many practical reasons and the scanning electron microscopy (SEM) technique is widely used for their visualization. Unfortunately, in the standard SEM images these precipitates are barely visible and finding them can be very difficult. Using the cathode lens (CL) mode in the SEM (so called SLEEM) these difficulties have been overcome and a very high contrast between the hexagonal-shaped .beta.-phase and the matrix has been obtained. Moreover, it has been found that the SLEEM images offer the possibility to distinguish between the hexagonal-shaped and the conventional .beta.-phase based on their different brightness, not only on their shape, which can be in some cases difficult or even impossible. Mg2Si precipitates have been also characterized by means of the scanning transmission low energy electron microscopy (STLEEM) method based on the using of a STEM detector in the SEM operated in the CL mode. Knowledge of the distribution and morphology of the Mg2Si precipitates (i.e. .beta.-phase) in Al-Mg-Si alloys are very important for many practical reasons and the scanning electron microscopy (SEM) technique is widely used for their visualization. Unfortunately, in the standard SEM images these precipitates are barely visible and finding them can be very difficult. Using the cathode lens (CL) mode in the SEM (so called SLEEM) these difficulties have been overcome and a very high contrast between the hexagonal-shaped .beta.-phase and the matrix has been obtained. Moreover, it has been found that the SLEEM images offer the possibility to distinguish between the hexagonal-shaped and the conventional .beta.-phase based on their different brightness, not only on their shape, which can be in some cases difficult or even impossible. Mg2Si precipitates have been also characterized by means of the scanning transmission low energy electron microscopy (STLEEM) method based on the using of a STEM detector in the SEM operated in the CL mode.
dcterms:title
Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques
skos:prefLabel
Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques
skos:notation
RIV/68081731:_____/14:00434111!RIV15-TA0-68081731
n4:aktivita
n19:P n19:I
n4:aktivity
I, P(TE01020118)
n4:dodaniDat
n6:2015
n4:domaciTvurceVysledku
n13:6440959
n4:druhVysledku
n16:D
n4:duvernostUdaju
n8:S
n4:entitaPredkladatele
n5:predkladatel
n4:idSjednocenehoVysledku
6922
n4:idVysledku
RIV/68081731:_____/14:00434111
n4:jazykVysledku
n12:eng
n4:klicovaSlova
SLEEM; STLEEM
n4:klicoveSlovo
n14:SLEEM n14:STLEEM
n4:kontrolniKodProRIV
[5ADE65D1A579]
n4:mistoKonaniAkce
Praha
n4:mistoVydani
Praha
n4:nazevZdroje
18th International Microscopy Congres. Proceedings
n4:obor
n20:JA
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
4
n4:projekt
n15:TE01020118
n4:rokUplatneniVysledku
n6:2014
n4:tvurceVysledku
Hida, S. Ligas, A. Matsuda, K. Mikmeková, Šárka
n4:typAkce
n9:WRD
n4:zahajeniAkce
2014-09-07+02:00
s:numberOfPages
2
n18:hasPublisher
Czechoslovak Microscopy Society
n17:isbn
978-80-260-6720-7