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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F14%3A00434110%21RIV15-TA0-68081731
rdf:type
skos:Concept n17:Vysledek
dcterms:description
The development of advanced materials is inseparably connected with detailed knowledge of the relationship between microstructure and mechanical properties. Traditional high-voltage scanning electron microscopy (SEM) is one of the most commonly used techniques for microstructure analysis, though it may be insufficient particularly for the characterization of advanced materials exhibiting a complex microstructure. The benefits of using slow electrons have been described in several articles. Experiments have been performed with a XHR SEM Magellan 400L (FEI Company) equipped with two detectors for secondary electrons (SE), an Everhart Thornley detector and an in-lens TLD detector, and solid-state BSE detector (CBS) located below the pole piece. This microscope can also be operated in the beam deceleration (BD) mode. The field of the BD not only decelerates the primary electrons, but also accelerates the emitted (signal) electrons towards the detector. Furthermore, high-angle backscattered electrons (BSE) are also collimated towards the optical axis and are detected. These electrons carry, first and foremost, crystal orientation contrast. SE and low-angle BSE can be detected by the TLD detector located inside the objective lens. Angle-resolved detection of BSE is performed using a CBS detector divided into four concentric segments. The development of advanced materials is inseparably connected with detailed knowledge of the relationship between microstructure and mechanical properties. Traditional high-voltage scanning electron microscopy (SEM) is one of the most commonly used techniques for microstructure analysis, though it may be insufficient particularly for the characterization of advanced materials exhibiting a complex microstructure. The benefits of using slow electrons have been described in several articles. Experiments have been performed with a XHR SEM Magellan 400L (FEI Company) equipped with two detectors for secondary electrons (SE), an Everhart Thornley detector and an in-lens TLD detector, and solid-state BSE detector (CBS) located below the pole piece. This microscope can also be operated in the beam deceleration (BD) mode. The field of the BD not only decelerates the primary electrons, but also accelerates the emitted (signal) electrons towards the detector. Furthermore, high-angle backscattered electrons (BSE) are also collimated towards the optical axis and are detected. These electrons carry, first and foremost, crystal orientation contrast. SE and low-angle BSE can be detected by the TLD detector located inside the objective lens. Angle-resolved detection of BSE is performed using a CBS detector divided into four concentric segments.
dcterms:title
Microstructural characterization of metallic materials using advanced SEM techniques Microstructural characterization of metallic materials using advanced SEM techniques
skos:prefLabel
Microstructural characterization of metallic materials using advanced SEM techniques Microstructural characterization of metallic materials using advanced SEM techniques
skos:notation
RIV/68081731:_____/14:00434110!RIV15-TA0-68081731
n3:aktivita
n7:I n7:P
n3:aktivity
I, P(TE01020118)
n3:dodaniDat
n18:2015
n3:domaciTvurceVysledku
n9:6440959 n9:9612653 n9:7362722
n3:druhVysledku
n13:D
n3:duvernostUdaju
n20:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
29238
n3:idVysledku
RIV/68081731:_____/14:00434110
n3:jazykVysledku
n10:eng
n3:klicovaSlova
SLEEM; low voltage microscopy; SEM
n3:klicoveSlovo
n14:SEM n14:SLEEM n14:low%20voltage%20microscopy
n3:kontrolniKodProRIV
[9311196106C1]
n3:mistoKonaniAkce
Praha
n3:mistoVydani
Praha
n3:nazevZdroje
18th International Microscopy Congres. Proceedings
n3:obor
n8:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
5
n3:projekt
n6:TE01020118
n3:rokUplatneniVysledku
n18:2014
n3:tvurceVysledku
Jandová, D. Piňos, Jakub Mikmeková, Šárka Konvalina, Ivo Kasl, J.
n3:typAkce
n15:WRD
n3:zahajeniAkce
2014-09-07+02:00
s:numberOfPages
2
n19:hasPublisher
Czechoslovak Microscopy Society
n12:isbn
978-80-260-6720-7