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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F13%3A00395139%21RIV14-TA0-68081731
rdf:type
n3:Vysledek skos:Concept
dcterms:description
We have designed a supporting system to fix a sample holder of a scanning tunneling microscope in an UHV chamber at room temperature. The microscope will operate down to a temperature of 20 K. Low thermal conductance, high mechanical stiffness, and small dimensions are the main features of the supporting system. Three sets of four glass balls placed in vertices of a tetrahedron are used for thermal insulation based on small contact areas between the glass balls. We have analyzed the thermal conductivity of the contacts between the balls mutually and between a ball and a metallic plate while the results have been applied to the entire support. The calculation based on a simple model of the setup has been verified with some experimental measurements. In comparison with other feasible supporting structures, the designed support has the lowest thermal conductance. We have designed a supporting system to fix a sample holder of a scanning tunneling microscope in an UHV chamber at room temperature. The microscope will operate down to a temperature of 20 K. Low thermal conductance, high mechanical stiffness, and small dimensions are the main features of the supporting system. Three sets of four glass balls placed in vertices of a tetrahedron are used for thermal insulation based on small contact areas between the glass balls. We have analyzed the thermal conductivity of the contacts between the balls mutually and between a ball and a metallic plate while the results have been applied to the entire support. The calculation based on a simple model of the setup has been verified with some experimental measurements. In comparison with other feasible supporting structures, the designed support has the lowest thermal conductance.
dcterms:title
Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope
skos:prefLabel
Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope Low conductive support for thermal insulation of a sample holder of a variable temperature scanning tunneling microscope
skos:notation
RIV/68081731:_____/13:00395139!RIV14-TA0-68081731
n3:predkladatel
n13:ico%3A68081731
n6:aktivita
n11:P n11:I
n6:aktivity
I, P(ED0017/01/01), P(TE01020233)
n6:cisloPeriodika
8
n6:dodaniDat
n18:2014
n6:domaciTvurceVysledku
n14:5565103 n14:1160877
n6:druhVysledku
n8:J
n6:duvernostUdaju
n17:S
n6:entitaPredkladatele
n16:predkladatel
n6:idSjednocenehoVysledku
85460
n6:idVysledku
RIV/68081731:_____/13:00395139
n6:jazykVysledku
n7:eng
n6:klicovaSlova
Thermal conductiviy; Scanning tunneling microscope
n6:klicoveSlovo
n12:Scanning%20tunneling%20microscope n12:Thermal%20conductiviy
n6:kodStatuVydavatele
US - Spojené státy americké
n6:kontrolniKodProRIV
[69B631FEC2CE]
n6:nazevZdroje
Review of Scientific Instruments
n6:obor
n15:JA
n6:pocetDomacichTvurcuVysledku
2
n6:pocetTvurcuVysledku
3
n6:projekt
n10:TE01020233 n10:ED0017%2F01%2F01
n6:rokUplatneniVysledku
n18:2013
n6:svazekPeriodika
84
n6:tvurceVysledku
Hanzelka, Pavel Vonka, J. Musilová, Věra
n6:wos
000323947400059
s:issn
0034-6748
s:numberOfPages
6
n9:doi
10.1063/1.4817214