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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F12%3A00387268%21RIV13-AV0-68081731
rdf:type
skos:Concept n14:Vysledek
dcterms:description
Annular dark-field scanning transmission electron microscopy (ADF STEM) at lower electron energies recently became important for direct imaging of samples consisting of elements with lower atomic numbers without the need of any additional contrast enhancement like staining by heavy atoms. Furthermore, the ADF STEM offers the opportunity for quantitative studies such as mass measurements of organic (biological and non-bilological) and inorganic specimens at the nanoscale. Here, we present the hardware and software extensions of a commercial high resolution scanning electron microscope (SEM) for the above manitoned applications. Annular dark-field scanning transmission electron microscopy (ADF STEM) at lower electron energies recently became important for direct imaging of samples consisting of elements with lower atomic numbers without the need of any additional contrast enhancement like staining by heavy atoms. Furthermore, the ADF STEM offers the opportunity for quantitative studies such as mass measurements of organic (biological and non-bilological) and inorganic specimens at the nanoscale. Here, we present the hardware and software extensions of a commercial high resolution scanning electron microscope (SEM) for the above manitoned applications.
dcterms:title
Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope
skos:prefLabel
Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope Mass measurements using electron scattering employing an %22in-lens%22 scanning electron microscope
skos:notation
RIV/68081731:_____/12:00387268!RIV13-AV0-68081731
n14:predkladatel
n15:ico%3A68081731
n3:aktivita
n8:P n8:I
n3:aktivity
I, P(EE.2.3.20.0103)
n3:dodaniDat
n10:2013
n3:domaciTvurceVysledku
n7:4794249
n3:druhVysledku
n4:D
n3:duvernostUdaju
n13:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
148576
n3:idVysledku
RIV/68081731:_____/12:00387268
n3:jazykVysledku
n21:eng
n3:klicovaSlova
STEM; ADF; cryo-EM
n3:klicoveSlovo
n12:cryo-EM n12:ADF n12:STEM
n3:kontrolniKodProRIV
[C2160FF7588B]
n3:mistoKonaniAkce
Manchester
n3:mistoVydani
Manchester
n3:nazevZdroje
EMC 2012. Proceedings of the 15th European Microscopy Congress
n3:obor
n11:BH
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
5
n3:projekt
n18:EE.2.3.20.0103
n3:rokUplatneniVysledku
n10:2012
n3:tvurceVysledku
Tacke, S. Reichelt, R. Schönhoff, M. Sporenberg, N. Krzyžánek, Vladislav
n3:typAkce
n19:WRD
n3:zahajeniAkce
2012-09-16+02:00
s:numberOfPages
2
n17:hasPublisher
The Royal Microscopical Society
n20:isbn
978-0-9502463-6-9