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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F12%3A00386393%21RIV13-AV0-68081731
rdf:type
n6:Vysledek skos:Concept
dcterms:description
Progress in materials science and engineering is inseparably connected with excellent knowledge of the correlation between materials properties and their microstructure. In our experiment an ultra-high vacuum scaning low energy electron microscope (UHV SLEEM) of an in-house design was used to observe microstructure of specimens. The UHV SLEEM is equipped with the cathode lens (CL) assembly, which enables us to observe samples at arbitrary landing energies of primary electrons. The device provides argon ion beam for in-situ cleaning of the specimen surface. Progress in materials science and engineering is inseparably connected with excellent knowledge of the correlation between materials properties and their microstructure. In our experiment an ultra-high vacuum scaning low energy electron microscope (UHV SLEEM) of an in-house design was used to observe microstructure of specimens. The UHV SLEEM is equipped with the cathode lens (CL) assembly, which enables us to observe samples at arbitrary landing energies of primary electrons. The device provides argon ion beam for in-situ cleaning of the specimen surface.
dcterms:title
Characterization of industrial materials by slow and very slow electrons Characterization of industrial materials by slow and very slow electrons
skos:prefLabel
Characterization of industrial materials by slow and very slow electrons Characterization of industrial materials by slow and very slow electrons
skos:notation
RIV/68081731:_____/12:00386393!RIV13-AV0-68081731
n6:predkladatel
n8:ico%3A68081731
n3:aktivita
n10:I
n3:aktivity
I
n3:dodaniDat
n16:2013
n3:domaciTvurceVysledku
n11:6440959 n11:7708017 n11:9000984
n3:druhVysledku
n13:D
n3:duvernostUdaju
n17:S
n3:entitaPredkladatele
n19:predkladatel
n3:idSjednocenehoVysledku
126819
n3:idVysledku
RIV/68081731:_____/12:00386393
n3:jazykVysledku
n12:eng
n3:klicovaSlova
low energy scanning electron microscopy; complex steels; microstructure of materials
n3:klicoveSlovo
n4:microstructure%20of%20materials n4:low%20energy%20scanning%20electron%20microscopy n4:complex%20steels
n3:kontrolniKodProRIV
[6845723C2674]
n3:mistoKonaniAkce
Skalský dvůr
n3:mistoVydani
Brno
n3:nazevZdroje
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
n3:obor
n15:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:rokUplatneniVysledku
n16:2012
n3:tvurceVysledku
Frank, Luděk Müllerová, Ilona Mikmeková, Šárka
n3:typAkce
n9:WRD
n3:zahajeniAkce
2012-06-25+02:00
s:numberOfPages
2
n18:hasPublisher
Institute of Scientific Instruments AS CR, v.v.i
n20:isbn
978-80-87441-07-7