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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F12%3A00386388%21RIV13-GA0-68081731
rdf:type
n11:Vysledek skos:Concept
dcterms:description
Scattering of electrons, injected into solids in order to produce an electron optical image of their surfaces, is governed by inner potentional of the sample with its spatial distribution inherent to the target structure. Except truly amorphous materials of the spatial arrangement range shorter than the interaction volume of electrons, we meet anisotropic scattering with the resulting image signal responding to the local crystalline structure. Incident electrons undergo scattering events the number of wich depends on their energy and on the scattering cross section of the material and the final emitted current results from statistics of these events. Scattering of electrons, injected into solids in order to produce an electron optical image of their surfaces, is governed by inner potentional of the sample with its spatial distribution inherent to the target structure. Except truly amorphous materials of the spatial arrangement range shorter than the interaction volume of electrons, we meet anisotropic scattering with the resulting image signal responding to the local crystalline structure. Incident electrons undergo scattering events the number of wich depends on their energy and on the scattering cross section of the material and the final emitted current results from statistics of these events.
dcterms:title
Surface crystallinity at the sight of electrons Surface crystallinity at the sight of electrons
skos:prefLabel
Surface crystallinity at the sight of electrons Surface crystallinity at the sight of electrons
skos:notation
RIV/68081731:_____/12:00386388!RIV13-GA0-68081731
n11:predkladatel
n12:ico%3A68081731
n3:aktivita
n15:P n15:I
n3:aktivity
I, P(GAP108/11/2270)
n3:dodaniDat
n4:2013
n3:domaciTvurceVysledku
n5:2999625 n5:9000984 n5:6440959 n5:7708017
n3:druhVysledku
n21:D
n3:duvernostUdaju
n13:S
n3:entitaPredkladatele
n19:predkladatel
n3:idSjednocenehoVysledku
172530
n3:idVysledku
RIV/68081731:_____/12:00386388
n3:jazykVysledku
n20:eng
n3:klicovaSlova
scanning electron microscopy; backstattered electrons; crystal structure
n3:klicoveSlovo
n7:scanning%20electron%20microscopy n7:crystal%20structure n7:backstattered%20electrons
n3:kontrolniKodProRIV
[00291F9FB402]
n3:mistoKonaniAkce
Skalský dvůr
n3:mistoVydani
Brno
n3:nazevZdroje
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
n3:obor
n10:JA
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
4
n3:projekt
n17:GAP108%2F11%2F2270
n3:rokUplatneniVysledku
n4:2012
n3:tvurceVysledku
Frank, Luděk Mikmeková, Šárka Mika, Filip Müllerová, Ilona
n3:typAkce
n16:WRD
n3:zahajeniAkce
2012-06-25+02:00
s:numberOfPages
4
n6:hasPublisher
Institute of Scientific Instruments AS CR, v.v.i
n14:isbn
978-80-87441-07-7