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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F12%3A00386105%21RIV13-AV0-68081731
rdf:type
n7:Vysledek skos:Concept
dcterms:description
An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method. An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.
dcterms:title
Surface examination of ultra-sharp cold field-emission cathode Surface examination of ultra-sharp cold field-emission cathode
skos:prefLabel
Surface examination of ultra-sharp cold field-emission cathode Surface examination of ultra-sharp cold field-emission cathode
skos:notation
RIV/68081731:_____/12:00386105!RIV13-AV0-68081731
n7:predkladatel
n10:ico%3A68081731
n3:aktivita
n12:I n12:S n12:P
n3:aktivity
I, P(GAP102/11/0995), S
n3:dodaniDat
n18:2013
n3:domaciTvurceVysledku
n20:6440959
n3:druhVysledku
n17:D
n3:duvernostUdaju
n11:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
172539
n3:idVysledku
RIV/68081731:_____/12:00386105
n3:jazykVysledku
n21:eng
n3:klicovaSlova
ultra-sharp field-emission cathode; SLEEM; DRS
n3:klicoveSlovo
n8:DRS n8:SLEEM n8:ultra-sharp%20field-emission%20cathode
n3:kontrolniKodProRIV
[F6608494F1F9]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Brno
n3:nazevZdroje
New Trends in Physics 2012. Proceedings of the conference
n3:obor
n6:JA
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
5
n3:projekt
n13:GAP102%2F11%2F0995
n3:rokUplatneniVysledku
n18:2012
n3:tvurceVysledku
Mikmeková, Šárka Knápek, A. Klampár, M. Trčka, T. Brüstlová, J.
n3:typAkce
n14:EUR
n3:zahajeniAkce
2012-10-11+02:00
s:numberOfPages
6
n4:hasPublisher
University of technology
n15:isbn
978-80-214-4594-9