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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F12%3A00379918%21RIV13-GA0-68081731
rdf:type
n3:Vysledek skos:Concept
dcterms:description
Methods employing the emission of backscattered electrons from surfaces of materials in determination of their chemical composition and crystallinic and electronic structures are summarized. Methods employing the emission of backscattered electrons from surfaces of materials in determination of their chemical composition and crystallinic and electronic structures are summarized.
dcterms:title
Backscattered electrons in examination of materials Backscattered electrons in examination of materials
skos:prefLabel
Backscattered electrons in examination of materials Backscattered electrons in examination of materials
skos:notation
RIV/68081731:_____/12:00379918!RIV13-GA0-68081731
n3:predkladatel
n16:ico%3A68081731
n4:aktivita
n18:P n18:I
n4:aktivity
I, P(GAP108/11/2270)
n4:dodaniDat
n5:2013
n4:domaciTvurceVysledku
n12:9000984 n12:7708017 n12:6440959 n12:8014531
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n6:D
n4:duvernostUdaju
n14:S
n4:entitaPredkladatele
n15:predkladatel
n4:idSjednocenehoVysledku
124368
n4:idVysledku
RIV/68081731:_____/12:00379918
n4:jazykVysledku
n20:eng
n4:klicovaSlova
scanning electron microscope; backscattered electrons; cathode lens
n4:klicoveSlovo
n7:cathode%20lens n7:backscattered%20electrons n7:scanning%20electron%20microscope
n4:kontrolniKodProRIV
[5E19293E47E4]
n4:mistoKonaniAkce
Perth
n4:mistoVydani
Wembley
n4:nazevZdroje
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22
n4:obor
n10:JA
n4:pocetDomacichTvurcuVysledku
4
n4:pocetTvurcuVysledku
5
n4:projekt
n13:GAP108%2F11%2F2270
n4:rokUplatneniVysledku
n5:2012
n4:tvurceVysledku
Matsuda, K. Frank, Luděk Pokorná, Zuzana Mikmeková, Šárka Müllerová, Ilona
n4:typAkce
n19:WRD
n4:zahajeniAkce
2012-02-05+01:00
s:numberOfPages
2
n21:hasPublisher
EECW Pty Ltd
n11:isbn
978-1-74052-245-8