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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F11%3A00367893%21RIV12-MSM-68081731
rdf:type
skos:Concept n16:Vysledek
dcterms:description
The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged. The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by relative scarcity of these instruments in research institutes and laboratories. This paper reports the results obtained from an investigation of the microstructure of ultra fine-grained (UFG) copper fabricated using equal channel angular pressing (ECAP) method, namely in the as-pressed state and after annealing. SLEEM is very sensitive to the perfection of crystal lattice and using SLEEM, local strain can be effectively imaged.
dcterms:title
Strain Mapping by Scanning Low Energy Electron Microscopy Strain Mapping by Scanning Low Energy Electron Microscopy
skos:prefLabel
Strain Mapping by Scanning Low Energy Electron Microscopy Strain Mapping by Scanning Low Energy Electron Microscopy
skos:notation
RIV/68081731:_____/11:00367893!RIV12-MSM-68081731
n16:predkladatel
n22:ico%3A68081731
n4:aktivita
n5:Z n5:P
n4:aktivity
P(IAA100650902), P(OE08012), Z(AV0Z20650511)
n4:dodaniDat
n6:2012
n4:domaciTvurceVysledku
n7:7708017 n7:6440959 n7:9000984 n7:5981689
n4:druhVysledku
n15:D
n4:duvernostUdaju
n21:S
n4:entitaPredkladatele
n23:predkladatel
n4:idSjednocenehoVysledku
232465
n4:idVysledku
RIV/68081731:_____/11:00367893
n4:jazykVysledku
n8:eng
n4:klicovaSlova
scanning low energy electron microscopy (SLEEM); contrast of crystal orientation; microscopic strain
n4:klicoveSlovo
n10:contrast%20of%20crystal%20orientation n10:scanning%20low%20energy%20electron%20microscopy%20%28SLEEM%29 n10:microscopic%20strain
n4:kontrolniKodProRIV
[F1131154BA3E]
n4:mistoKonaniAkce
Brno
n4:mistoVydani
Zurich
n4:nazevZdroje
Materials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465)
n4:obor
n17:JA
n4:pocetDomacichTvurcuVysledku
4
n4:pocetTvurcuVysledku
7
n4:projekt
n13:OE08012 n13:IAA100650902
n4:rokUplatneniVysledku
n6:2011
n4:tvurceVysledku
Kouřil, M. Man, O. Frank, Luděk Müllerová, Ilona Mikmeková, Šárka Pantělejev, L. Hovorka, Miloš
n4:typAkce
n11:WRD
n4:wos
000291704700077
n4:zahajeniAkce
2010-06-28+02:00
n4:zamer
n12:AV0Z20650511
s:numberOfPages
4
n20:doi
10.4028/www.scientific.net/KEM.465.338
n19:hasPublisher
Trans Tech Publications
n18:isbn
978-3-03785-006-0