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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F11%3A00367773%21RIV12-AV0-68081731
rdf:type
skos:Concept n11:Vysledek
dcterms:description
Immesrsion of the sample in a scanning electron microscope to strong electric field enables one to acquire the backscattered electrons (BSE) throughout full energy and angle range of emission. BSE emitted at high angles off the surface normal provide extended crystallographic information with high grain contrast sensitive to details including visualization of the internal stress. At very low energies the BSE yield may serve as fingerprinting the grain orientation. The dopant contrast can be obtained via injection of very slow electrons. Immesrsion of the sample in a scanning electron microscope to strong electric field enables one to acquire the backscattered electrons (BSE) throughout full energy and angle range of emission. BSE emitted at high angles off the surface normal provide extended crystallographic information with high grain contrast sensitive to details including visualization of the internal stress. At very low energies the BSE yield may serve as fingerprinting the grain orientation. The dopant contrast can be obtained via injection of very slow electrons.
dcterms:title
Unconventional Imaging with Backscattered Electrons Unconventional Imaging with Backscattered Electrons
skos:prefLabel
Unconventional Imaging with Backscattered Electrons Unconventional Imaging with Backscattered Electrons
skos:notation
RIV/68081731:_____/11:00367773!RIV12-AV0-68081731
n11:predkladatel
n12:ico%3A68081731
n3:aktivita
n18:Z
n3:aktivity
Z(AV0Z20650511)
n3:cisloPeriodika
Suppl. 2
n3:dodaniDat
n4:2012
n3:domaciTvurceVysledku
n9:7708017 n9:6440959 n9:5981689 n9:9000984
n3:druhVysledku
n19:J
n3:duvernostUdaju
n17:S
n3:entitaPredkladatele
n10:predkladatel
n3:idSjednocenehoVysledku
236783
n3:idVysledku
RIV/68081731:_____/11:00367773
n3:jazykVysledku
n15:eng
n3:klicovaSlova
SEM; low energies; grain contrast; dopant contrast; internal stress
n3:klicoveSlovo
n6:grain%20contrast n6:low%20energies n6:internal%20stress n6:dopant%20contrast n6:SEM
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[7270D216128B]
n3:nazevZdroje
Microscopy and Microanalysis
n3:obor
n16:JA
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
4
n3:rokUplatneniVysledku
n4:2011
n3:svazekPeriodika
17
n3:tvurceVysledku
Hovorka, Miloš Mikmeková, Šárka Müllerová, Ilona Frank, Luděk
n3:zamer
n13:AV0Z20650511
s:issn
1431-9276
s:numberOfPages
2
n14:doi
10.1017/S143192761100537X