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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F10%3A00352416%21RIV11-MSM-68081731
rdf:type
n14:Vysledek skos:Concept
dcterms:description
An important role of the scanning electron microscopy (SEM) is to image and examine the local crystallinic structure of materials. As an alternative to the traditional EBSD method, suffering from slow data collection and limited lateral resolution, employment of very slow backscattered electrons (BSE) and of BSE leaving the sample at high angles with respect to the surface normal appears very promising. Neither of these signals is available in conventional SEM devices as the former species have insufficient energy to be detected while the later usually miss the detector. An important role of the scanning electron microscopy (SEM) is to image and examine the local crystallinic structure of materials. As an alternative to the traditional EBSD method, suffering from slow data collection and limited lateral resolution, employment of very slow backscattered electrons (BSE) and of BSE leaving the sample at high angles with respect to the surface normal appears very promising. Neither of these signals is available in conventional SEM devices as the former species have insufficient energy to be detected while the later usually miss the detector.
dcterms:title
Low Energy Reflection and High Angle Reflection of Electrons in the SEM Low Energy Reflection and High Angle Reflection of Electrons in the SEM
skos:prefLabel
Low Energy Reflection and High Angle Reflection of Electrons in the SEM Low Energy Reflection and High Angle Reflection of Electrons in the SEM
skos:notation
RIV/68081731:_____/10:00352416!RIV11-MSM-68081731
n3:aktivita
n15:P n15:Z
n3:aktivity
P(OE08012), Z(AV0Z20650511)
n3:dodaniDat
n10:2011
n3:domaciTvurceVysledku
n7:7708017 n7:9000984 n7:6440959 n7:5981689
n3:druhVysledku
n11:D
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n9:predkladatel
n3:idSjednocenehoVysledku
268953
n3:idVysledku
RIV/68081731:_____/10:00352416
n3:jazykVysledku
n4:eng
n3:klicovaSlova
scanning electron microscopy; crystallinic structure; slow backscattered electrons
n3:klicoveSlovo
n6:crystallinic%20structure n6:scanning%20electron%20microscopy n6:slow%20backscattered%20electrons
n3:kontrolniKodProRIV
[DF8FCE3300A0]
n3:mistoKonaniAkce
Rio de Janeiro
n3:mistoVydani
Rio de Janeiro
n3:nazevZdroje
Proceedings of the 17th IFSM International Microscopy Congress
n3:obor
n19:JA
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
4
n3:projekt
n21:OE08012
n3:rokUplatneniVysledku
n10:2010
n3:tvurceVysledku
Müllerová, Ilona Frank, Luděk Hovorka, Miloš Mikmeková, Šárka
n3:typAkce
n16:WRD
n3:zahajeniAkce
2010-09-19+02:00
n3:zamer
n20:AV0Z20650511
s:numberOfPages
2
n5:hasPublisher
Sociedade Brasileira de Microscopia e Microanilise
n12:isbn
978-85-63273-06-2