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Statements

Subject Item
n2:RIV%2F68081731%3A_____%2F10%3A00350665%21RIV11-MSM-68081731
rdf:type
n18:Vysledek skos:Concept
dcterms:description
The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by the relative scarcity of these instruments in research institutes and laboratories. Various techniques exist which are capable of studying the material microstructure, with the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channeling, mostly in the Mott scattering angular range. The use of the scanning low energy electron microscopy (SLEEM) has been slowly making its way into the field of materials science, hampered not by limitations in the technique but rather by the relative scarcity of these instruments in research institutes and laboratories. Various techniques exist which are capable of studying the material microstructure, with the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way to visualizing the microstructure of materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enables us to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channeling, mostly in the Mott scattering angular range.
dcterms:title
Prospects of the scanning low energy electron microscopy in materials science Prospects of the scanning low energy electron microscopy in materials science
skos:prefLabel
Prospects of the scanning low energy electron microscopy in materials science Prospects of the scanning low energy electron microscopy in materials science
skos:notation
RIV/68081731:_____/10:00350665!RIV11-MSM-68081731
n3:aktivita
n10:P n10:Z
n3:aktivity
P(OE08012), Z(AV0Z20650511)
n3:dodaniDat
n7:2011
n3:domaciTvurceVysledku
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n6:D
n3:duvernostUdaju
n17:S
n3:entitaPredkladatele
n15:predkladatel
n3:idSjednocenehoVysledku
283001
n3:idVysledku
RIV/68081731:_____/10:00350665
n3:jazykVysledku
n4:eng
n3:klicovaSlova
scanning low energy electron microscopy; scanning electron microscopy; transmission electron microscopy; focused ion beam microscopy; cathode lens mode
n3:klicoveSlovo
n14:scanning%20low%20energy%20electron%20microscopy n14:scanning%20electron%20microscopy n14:transmission%20electron%20microscopy n14:cathode%20lens%20mode n14:focused%20ion%20beam%20microscopy
n3:kontrolniKodProRIV
[16D54E418E77]
n3:mistoKonaniAkce
Skalský dvůr
n3:mistoVydani
Brno
n3:nazevZdroje
Proceedings of the 12th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
n3:obor
n16:JA
n3:pocetDomacichTvurcuVysledku
5
n3:pocetTvurcuVysledku
5
n3:projekt
n13:OE08012
n3:rokUplatneniVysledku
n7:2010
n3:tvurceVysledku
Müllerová, Ilona Konvalina, Ivo Frank, Luděk Hovorka, Miloš Mikmeková, Šárka
n3:typAkce
n12:WRD
n3:zahajeniAkce
2010-05-31+02:00
n3:zamer
n8:AV0Z20650511
s:numberOfPages
2
n19:hasPublisher
Institute of Scientific Instruments AS CR, v.v.i
n20:isbn
978-80-254-6842-5